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Grasser, T.
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1

Process implications on the stability and reliability of 30..:

Illarionov, Yu. Yu. ; Karl, A. ; Smets, Q....
npj 2D Materials and Applications.  8 (2024)  1 - p. , 2024
Link: https://doi.org/10.1038/..
 
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2

A Recombination-Enhanced-Defect-Reaction-Based Model for th..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Grasser, T. ; Feil, M. ; Waschneck, K.... - p. 3B.1-1-3B.1-7 , 2024
Link: https://doi.org/10.1109/..
 
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3

Quantifying Defect-Mediated Electron Capture and Emission i..:

, In: 2024 Device Research Conference (DRC),
Yang, J.A. ; Reato, E. ; Knobloch, T.... - p. 1-2 , 2024
Link: https://doi.org/10.1109/..
 
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4

Variability and high temperature reliability of graphene fi..:

Illarionov, Yu. Yu. ; Knobloch, T. ; Uzlu, B....
npj 2D Materials and Applications.  8 (2024)  1 - p. , 2024
Link: https://doi.org/10.1038/..
 
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5

Variability in Si/SiGe and Si/SiO2 Spin Qubits due to Inter..:

, In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Cvitkovich, L. ; Sklenard, B. ; Waldhor, D.... - p. 341-344 , 2023
Link: https://doi.org/10.23919..
 
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6

Reliability Assessment of Double-Gated Wafer-Scale MoS2 Fie..:

, In: 2023 International Electron Devices Meeting (IEDM),
Provias, A. ; Knobloch, T. ; Kitamura, A.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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7

A Comprehensive Cryogenic CMOS Variability and Reliability ..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Grill, A. ; Michl, J. ; Diaz-Fortuny, J.... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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8

Insulators for Devices Based on 2D Materials:

, In: 2023 IEEE Nanotechnology Materials and Devices Conference (NMDC),
Grasser, T. ; Waldhor, D. ; Knobloch, T. - p. 628-628 , 2023
Link: https://doi.org/10.1109/..
 
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9

Revealing the Impact of Gate Area Scaling on Charge Trappin..:

Tselios, K. ; Knobloch, T. ; Waldhoer, D....
IEEE Transactions on Device and Materials Reliability.  23 (2023)  3 - p. 355-362 , 2023
Link: https://doi.org/10.1109/..
 
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10

Modeling the Performance and Reliability of Two-Dimensional..:

, In: 2023 International Electron Devices Meeting (IEDM),
Knobloch, T. ; Waldhoer, D. ; Davoudi, M. R.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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11

Design and characterization of the Sandia free-piston refle..:

Lynch, K. P. ; Grasser, T. ; Spillers, R....
Shock Waves.  33 (2023)  4 - p. 299-314 , 2023
Link: https://doi.org/10.1007/..
 
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12

Impact of Single Defects on NBTI and PBTI Recovery in SiO2 ..:

, In: 2022 IEEE International Integrated Reliability Workshop (IIRW),
Tselios, K. ; Knobloch, T. ; Michl, J.... - p. 1-5 , 2022
Link: https://doi.org/10.1109/..
 
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13

The Importance of Secondary Generated Carriers in Modeling ..:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Jech, M. ; Grasser, T. ; Waltl, M. - p. 265-267 , 2022
Link: https://doi.org/10.1109/..
 
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14

Low-temperature atomic and molecular hydrogen anneals for e..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Franco, J. ; Arimura, H. ; de Marneffe, J.-F.... - p. 31.4.1-31.4.4 , 2021
Link: https://doi.org/10.1109/..
 
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15

Multiscale Modeling Study of Native Oxide Growth on a Si(10..:

, In: ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC),
Cvitkovich, L. ; Jech, M. ; Waldhor, D.... - p. 235-238 , 2021
Link: https://doi.org/10.1109/..
 
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