Grehl, T.
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1

Surface composition of ion bombarded nickel based alloys:

Chernysh, V.S. ; Brongersma, H.H. ; Brüner, P..
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  460 (2019)  - p. 180-184 , 2019
 
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2

P 48 The time of the ALSFRS-R to decrease to 50% (D50) in a..:

Stubendorff, B. ; Grehl, T. ; Neuwirth, C....
Clinical Neurophysiology.  128 (2017)  10 - p. e353-e354 , 2017
 
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4

Spatial Atmospheric Atomic Layer Deposition of InxGayZnzO f..:

Illiberi, A. ; Cobb, B. ; Sharma, A....
ACS Applied Materials & Interfaces.  7 (2015)  6 - p. 3671-3675 , 2015
 
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5

Diagnostik und Therapie der amyotrophen Lateralsklerose (AL..:

Grehl, T.
Fortschritte der Neurologie · Psychiatrie.  81 (2013)  10 - p. 592-604 , 2013
 
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Surface characterization of nanoparticles: different surfac..:

Kersting, R. ; Breitenstein, D. ; Hagenhoff, B....
Surface and Interface Analysis.  45 (2012)  1 - p. 503-505 , 2012
 
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7

Structure and chemical composition of mixed benzylguanine‐ ..:

Bruns, M. ; Barth, C. ; Brüner, P....
Surface and Interface Analysis.  44 (2012)  8 - p. 909-913 , 2012
 
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8

Ataxin-2 intermediate-length polyglutamine expansions in Eu..:

Lee, T. ; Li, Y. R. ; Ingre, C....
Human Molecular Genetics.  20 (2011)  9 - p. 1697-1700 , 2011
 
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10

MCs+ depth profiling using cluster primary ions:

Niehuis, E. ; Grehl, T. ; Kollmer, F....
Surface and Interface Analysis.  43 (2011)  1-2 - p. 204-206 , 2011
 
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11

Characterization of core/shell nanoparticle thin films for ..:

Fuchs, M. ; Breitenstein, D. ; Fartmann, M....
Surface and Interface Analysis.  42 (2010)  6-7 - p. 1131-1134 , 2010
 
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12

Surface- and Microanalysis by Low Energy Ion Scattering:

Grehl, T ; Niehuis, E ; Brongersma, HH
Microscopy and Microanalysis.  16 (2010)  S2 - p. 370-371 , 2010
 
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13

Depth profiling of organic materials using improved ion bea..:

Cramer, H.-G. ; Grehl, T. ; Kollmer, F....
Applied Surface Science.  255 (2008)  4 - p. 966-969 , 2008
 
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14

Mass spectrometric characterization of DNA microarrays as a..:

Hellweg, S. ; Jacob, A. ; Hoheisel, J.D...
Applied Surface Science.  252 (2006)  19 - p. 6742-6745 , 2006
 
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15

Low energy dual beam depth profiling: influence of sputter ..:

Grehl, T. ; Möllers, R. ; Niehuis, E.
Applied Surface Science.  203-204 (2003)  - p. 277-280 , 2003
 
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