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Grogger, W.
71
results:
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Online (71)
Mediatypes
E-Books (1)
Articles (Online) (63)
OpenAccess-fulltext (7)
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english (63)
german (2)
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1
High-resolution cross-sectional analysis of the interface b..:
Fisslthaler, E.
;
Haberfehlner, G.
;
Gspan, C.
..
Microelectronics Reliability. 100-101 (2019) - p. 113366 , 2019
Link:
https://doi.org/10.1016/..
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2
Fundamentals of electron energy-loss spectroscopy:
Hofer, F
;
Schmidt, F P
;
Grogger, W
.
IOP Conference Series: Materials Science and Engineering. 109 (2016) - p. 012007 , 2016
Link:
https://doi.org/10.1088/..
?
3
Gas Sensing Characterisation of CMOS Integrated Nanocrystal..:
Wimmer-Teubenbacher, R.
;
Steinhauer, S.
;
von Sicard, O.
...
Materials Today: Proceedings. 2 (2015) 8 - p. 4295-4301 , 2015
Link:
https://doi.org/10.1016/..
?
4
Low-frequency noise characterization of single CuO nanowire..:
Steinhauer, S.
;
Köck, A.
;
Gspan, C.
...
Applied Physics Letters. 107 (2015) 12 - p. , 2015
Link:
https://doi.org/10.1063/..
?
5
Quantitative EDX and EELS Elemental Mapping at Atomic Resol..:
Kothleitner, G.
;
Neish, M. J.
;
Lugg, N. R.
...
Microscopy and Microanalysis. 20 (2014) S3 - p. 570-571 , 2014
Link:
https://doi.org/10.1017/..
?
6
Sensitization of as Rolled and Stable Annealed Alloy 625:
Lackner, R.
;
Mori, G.
;
Egger, R.
...
BHM Berg- und Hüttenmännische Monatshefte. 159 (2014) 1 - p. 12-22 , 2014
Link:
https://doi.org/10.1007/..
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7
Channel length variation in self-aligned, nanoimprint litho..:
Rothländer, T.
;
Fian, A.
;
Kraxner, J.
...
Organic Electronics. 15 (2014) 11 - p. 3274-3281 , 2014
Link:
https://doi.org/10.1016/..
?
8
Quantitative Elemental Mapping at Atomic Resolution Using X..:
Kothleitner, G.
;
Neish, M. J.
;
Lugg, N. R.
...
Physical Review Letters. 112 (2014) 8 - p. , 2014
Link:
https://doi.org/10.1103/..
?
9
Gas sensing properties of novel CuO nanowire devices:
Steinhauer, S.
;
Brunet, E.
;
Maier, T.
...
Sensors and Actuators B: Chemical. 187 (2013) - p. 50-57 , 2013
Link:
https://doi.org/10.1016/..
?
10
TEM Sample Preparation of a Hard Metal by Semiautomatic Wed..:
Neumayer, S. M.
;
Fisslthaler, E.
;
Feistritzer, S.
.
Practical Metallography. 50 (2013) 5 - p. 304-317 , 2013
Link:
https://doi.org/10.3139/..
?
11
Comparison of the gas sensing performance of SnO2 thin film..:
Brunet, E.
;
Maier, T.
;
Mutinati, G.C.
...
Sensors and Actuators B: Chemical. 165 (2012) 1 - p. 110-118 , 2012
Link:
https://doi.org/10.1016/..
?
12
Synthesis of High-Aspect-Ratio CuO Nanowires for Conductome..:
Steinhauer, S.
;
Brunet, E.
;
Maier, T.
...
Procedia Engineering. 25 (2011) - p. 1477-1480 , 2011
Link:
https://doi.org/10.1016/..
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13
Magnetfeldkompensation in Elektronenmikroskopie-Räumen:
Friedl, K.
;
Fisslthaler, E.
;
Grogger, W.
.
e & i Elektrotechnik und Informationstechnik. 128 (2011) 11-12 - p. 395-403 , 2011
Link:
https://doi.org/10.1007/..
?
14
Microscopy and Microanalysis of Grain Boundaries in Cerium ..:
Winterstein, JP
;
Carter, CB
;
Grogger, W
.
Microscopy and Microanalysis. 16 (2010) S2 - p. 1416-1417 , 2010
Link:
https://doi.org/10.1017/..
?
15
Note: On the deconvolution of Kelvin probe force microscopy..:
Blümel, A.
;
Plank, H.
;
Klug, A.
...
Review of Scientific Instruments. 81 (2010) 5 - p. , 2010
Link:
https://doi.org/10.1063/..
1-15