Grogger, W.
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1

High-resolution cross-sectional analysis of the interface b..:

Fisslthaler, E. ; Haberfehlner, G. ; Gspan, C...
Microelectronics Reliability.  100-101 (2019)  - p. 113366 , 2019
 
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2

Fundamentals of electron energy-loss spectroscopy:

Hofer, F ; Schmidt, F P ; Grogger, W.
IOP Conference Series: Materials Science and Engineering.  109 (2016)  - p. 012007 , 2016
 
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5

Quantitative EDX and EELS Elemental Mapping at Atomic Resol..:

Kothleitner, G. ; Neish, M. J. ; Lugg, N. R....
Microscopy and Microanalysis.  20 (2014)  S3 - p. 570-571 , 2014
 
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6

Sensitization of as Rolled and Stable Annealed Alloy 625:

Lackner, R. ; Mori, G. ; Egger, R....
BHM Berg- und Hüttenmännische Monatshefte.  159 (2014)  1 - p. 12-22 , 2014
 
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9

Gas sensing properties of novel CuO nanowire devices:

Steinhauer, S. ; Brunet, E. ; Maier, T....
Sensors and Actuators B: Chemical.  187 (2013)  - p. 50-57 , 2013
 
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11

Comparison of the gas sensing performance of SnO2 thin film..:

Brunet, E. ; Maier, T. ; Mutinati, G.C....
Sensors and Actuators B: Chemical.  165 (2012)  1 - p. 110-118 , 2012
 
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13

Magnetfeldkompensation in Elektronenmikroskopie-Räumen:

Friedl, K. ; Fisslthaler, E. ; Grogger, W..
e & i Elektrotechnik und Informationstechnik.  128 (2011)  11-12 - p. 395-403 , 2011
 
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14

Microscopy and Microanalysis of Grain Boundaries in Cerium ..:

Winterstein, JP ; Carter, CB ; Grogger, W.
Microscopy and Microanalysis.  16 (2010)  S2 - p. 1416-1417 , 2010
 
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15

Note: On the deconvolution of Kelvin probe force microscopy..:

Blümel, A. ; Plank, H. ; Klug, A....
Review of Scientific Instruments.  81 (2010)  5 - p. , 2010
 
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