Gronthoud, Guido
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3

Re-configuration of sub-blocks for effective application of..:

, In: Proceedings of the conference on Design, automation and test in Europe,
 
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4

Power Supply Noise in Delay Testing:

, In: 2006 IEEE International Test Conference,
Wang, Jing ; H. Walker, D. M. ; Majhi, Ananta... - p. None , 2006
 
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6

Memory Testing Under Different Stress Conditions : An In..:

, In: Proceedings of the conference on Design, Automation and Test in Europe - Volume 1,
 
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7

Multi-VDD Testing for Analog Circuits:

de Gyvez, José Pineda ; Gronthoud, Guido ; Amine, Rachid
Journal of Electronic Testing.  21 (2005)  3 - p. 311-322 , 2005
 
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8

Algorithms for ADC multi-site test with digital input stimu..:

Sheng, Xiaoqin ; Kerkhoff, Hans ; Zjajo, Amir.
http://doc.utwente.nl/69800/1/algorithms_for_ADC_multi-site_Test_with_Digital_input_stimulus.pdf.  , 2009
 
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