E-LIB Suche - Ergebnisse für: Grossi, Alessandro

1

28nm Data Memory with Embedded RRAM Technology in Automotiv..:

, In: 2023 IEEE International Memory Workshop (IMW),

Grossi, Alessandro ; Coppetta, Matteo ; Aresu, Stefano... - p. 1-4 , 2023

2

Role of synaptic variability in resistive memory-based spik..:

Ly, Denys R B ; Grossi, Alessandro ; Fenouillet-Beranger, Claire...
Journal of Physics D: Applied Physics. 51 (2018) 44 - p. 444002 , 2018

Link: https://doi.org/10.1088/..

3

An Automated Test Equipment for Characterization of Emergin..:

Grossi, Alessandro ; Zambelli, Cristian ; Olivo, Piero...
IEEE Transactions on Emerging Topics in Computing. 6 (2018) 2 - p. 269-277 , 2018

Link: https://doi.org/10.1109/..

4

Impact of the precursor chemistry and process conditions on..:

Grossi, Alessandro ; Perez, Eduardo ; Zambelli, Cristian...
Scientific Reports. 8 (2018) 1 - p. , 2018

Link: https://doi.org/10.1038/..

5

Experimental Investigation of 4-kb RRAM Arrays Programming ..:

Grossi, Alessandro ; Vianello, Elisa ; Zambelli, Cristian...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 26 (2018) 12 - p. 2599-2607 , 2018

Link: https://doi.org/10.1109/..

6

Electrical characterization and modeling of 1T-1R RRAM arra..:

Grossi, Alessandro ; Zambelli, Cristian ; Olivo, Piero...
Solid-State Electronics. 128 (2017) - p. 187-193 , 2017

Link: https://doi.org/10.1016/..

7

Bioinspired Programming of Resistive Memory Devices for Imp..:

, In: Proceedings of the Great Lakes Symposium on VLSI 2017,

Vianello, Elisa ; Werner, Thilo ; Grossi, Alessandro... - p. 393-398 , 2017

Link: https://dl.acm.org/doi/1..

8

Mechanism of the Key Impact of Residual Carbon Content on t..:

Niu, Gang ; Cartoixà, Xavier ; Grossi, Alessandro...
The Journal of Physical Chemistry C. 121 (2017) 12 - p. 7005-7014 , 2017

Link: https://doi.org/10.1021/..

9

Electrical characterization and modeling of pulse-based for..:

Grossi, Alessandro ; Zambelli, Cristian ; Olivo, Piero...
Solid-State Electronics. 115 (2016) - p. 17-25 , 2016

Link: https://doi.org/10.1016/..

10

Resistive RAM endurance: Array-level characterization and c..:

Grossi, Alessandro ; Vianello, Elisa ; Sabry, Mohamed M...
info:eu-repo/semantics/altIdentifier/wos/WOS:000460970400022. , 2019

Link: http://hdl.handle.net/11..

11

An automated test equipment for characterization of emergin..:

Grossi, Alessandro ; Zambelli, Cristian ; Olivo, Piero...
info:eu-repo/semantics/altIdentifier/wos/WOS:000434474200010. , 2018

Link: http://hdl.handle.net/11..

12

Role of synaptic variability in resistive memory-based spik..:

Ly, Denys ; Grossi, Alessandro ; Fenouillet-Beranger, Claire...
info:eu-repo/semantics/altIdentifier/doi/10.1088/1361-6463/aad954. , 2018

Link: https://hal.science/hal-..

13

Experimental Investigation of 4-kb RRAM Arrays Programming ..:

Grossi, Alessandro ; Vianello, Elisa ; Zambelli, Cristian...
info:eu-repo/semantics/altIdentifier/wos/WOS:000451999000005. , 2018

Link: http://hdl.handle.net/11..

14

Impact of the precursor chemistry and process conditions on..:

Grossi, Alessandro ; Perez, Eduardo ; Zambelli, Cristian...
info:eu-repo/semantics/altIdentifier/pmid/30042433. , 2018

Link: http://hdl.handle.net/11..

15

Impact of the precursor chemistry and process conditions on..:

Grossi, Alessandro ; Perez, Eduardo ; Zambelli, Cristian...
Scientific reports. , 2018

Link: https://ddd.uab.cat/reco..