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Grossner, Laura M.
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1

Further Studies of the Cap Pushing Response in Honey Bees (..:

Wincheski, Riley J. ; Stauch, Kiri Li N. ; Grossner, Laura M....
Natural Science.  16 (2024)  5 - p. 45-64 , 2024
Link: https://doi.org/10.4236/..
 
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2

Diminished neural network dynamics in amnestic mild cogniti..:

Brenner, Einat K. ; Hampstead, Benjamin M. ; Grossner, Emily C....
International Journal of Psychophysiology.  130 (2018)  - p. 63-72 , 2018
Link: https://doi.org/10.1016/..
 
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3

Single fiber model of particle retention in an acoustically..:

Grossner, Michael T. ; Penrod, Alan E. ; Belovich, Joanne M..
Ultrasonics.  41 (2003)  2 - p. 65-74 , 2003
Link: https://doi.org/10.1016/..
 
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4

Exploring the border traps near the valence band in the SiO..:

Kumar, P. ; Medeiros, H. G. ; Race, S....
Physical Review Applied.  21 (2024)  6 - p. , 2024
Link: https://doi.org/10.1103/..
 
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5

Radiation-Induced Effects in SiC Vertical Power MOSFETs Irr..:

Bonaldo, S. ; Martinella, C. ; Race, S....
IEEE Transactions on Nuclear Science.  71 (2024)  4 - p. 418-426 , 2024
Link: https://doi.org/10.1109/..
 
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6

Al-implantation induced damage in 4H-SiC:

Kumar, P. ; Martins, M.I.M. ; Bathen, M.E...
Materials Science in Semiconductor Processing.  174 (2024)  - p. 108241 , 2024
Link: https://doi.org/10.1016/..
 
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7

Exploring the border traps near the SiO2-SiC interface usin..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Kumar, P. ; Krummenacher, M. ; Medeiros, H. G.... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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8

Electrically active defects induced by thermal oxidation an..:

Kumar, P. ; Bathen, M. E. ; Martins, M. I. M...
Journal of Applied Physics.  135 (2024)  18 - p. , 2024
Link: https://doi.org/10.1063/..
 
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9

Charge State Control over Point Defects in Sic Devices:

Bathen, Marianne Etzelmüller ; Selnesaunet, Gard M. ; Enga, Marius Johan...
Defect and Diffusion Forum.  425 (2023)  - p. 35-42 , 2023
Link: https://doi.org/10.4028/..
 
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10

Feeding the machine: Challenges to reproducible predictive ..:

Cwiek, Andrew ; Rajtmajer, Sarah M. ; Wyble, Bradley...
Network Neuroscience.  , 2022
Link: https://doi.org/10.1162/..
 
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11

Heavy-ion induced single event effects and latent damages i..:

Martinella, C. ; Natzke, P. ; Alia, R.G....
Microelectronics Reliability.  128 (2022)  - p. 114423 , 2022
Link: https://doi.org/10.1016/..
 
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12

Characterization methods for defects and devices in silicon..:

Bathen, M. E. ; Lew, C. T.-K. ; Woerle, J....
Journal of Applied Physics.  131 (2022)  14 - p. , 2022
Link: https://doi.org/10.1063/..
 
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13

Impact of Terrestrial Neutrons on the Reliability of SiC VD..:

Martinella, C. ; Alia, R. G. ; Stark, R....
IEEE Transactions on Nuclear Science.  68 (2021)  5 - p. 634-641 , 2021
Link: https://doi.org/10.1109/..
 
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14

Muon Interaction with Negative-U and High-Spin-State Defect..:

Woerle, J. ; Bathen, M.E. ; Prokscha, T....
Physical Review Applied.  14 (2020)  5 - p. , 2020
Link: https://doi.org/10.1103/..
 
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15

Evaluation der Aufnahmekriterien von Patienten nach Verkehr..:

Stephan, J. C. ; Grossner, T. ; Stephan-Paulsen, L. M....
Notfall + Rettungsmedizin.  24 (2020)  2 - p. 134-142 , 2020
Link: https://doi.org/10.1007/..
 
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