Guldi, R.
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1

Systematic and random defect reduction during the evolution..:

, In: 10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295),
Guldi, R. ; Winter, T. ; Sridhar, N.... - p. 2,3,4,5,6,7 , 1999
 
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2

Source/Drain Dislocations and Electrical Leakage in Titaniu..:

Guldi, R. L.
Journal of The Electrochemical Society.  141 (1994)  7 - p. 1957-1963 , 1994
 
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3

Effect of Device Processing Conditions on Extended Dislocat..:

Guldi, R. L.
Journal of The Electrochemical Society.  140 (1993)  12 - p. 3650-3657 , 1993
 
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4

Characterization of Poly‐Buffered LOCOS in Manufacturing En..:

Guldi, R. L. ; McKee, B. ; Damminga, G. M...
Journal of The Electrochemical Society.  136 (1989)  12 - p. 3815-3820 , 1989
 
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Effects of Multiple Slice Epitaxy and Front End Processing ..:

Guldi, R. L. ; Fontana, R. E. ; Bullock, D. C.
Journal of The Electrochemical Society.  128 (1981)  3 - p. 675-678 , 1981
 
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Diffusion of lead and selenium in lead selenide:

Guldi, R. L. ; Walpole, J. N. ; Rediker, R. H.
Journal of Applied Physics.  44 (1973)  11 - p. 4896-4907 , 1973
 
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Research Methods for History 

Research Methods for the Arts and Humanities, RMAH
 
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Review—Single-Walled Carbon Nanohorn-Based Dye-Sensitized S..:

Lodermeyer, F. ; Costa, R. D. ; Guldi, D. M.
ECS Journal of Solid State Science and Technology.  6 (2017)  6 - p. M3140-M3147 , 2017
 
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