Hölck, Ole
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1

In-Package Characterization of Dielectrics Using Ring Reson..:

, In: 2024 15th German Microwave Conference (GeMiC),
 
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2

How to Manipulate Warpage in Fan-out Wafer and Panel Level ..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Braun, Tanja ; Holck, Ole ; Adler, Marius... - p. 1-6 , 2024
 
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3

A Closer Look to Fan-out Panel Level Packaging:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Braun, Tanja ; Holck, Ole ; Voitel, Marcus... - p. 1-3 , 2023
 
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4

Improving Warpage Characterization of Large Wafers in Fan-O..:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
Huber, Saskia ; Stegmaier, Andreas ; van Dijk, Marius... - p. 1332-1338 , 2023
 
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5

Warpage of Fan-Out Panel Level Packaging – Experimental and..:

, In: 2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
 
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6

In-situ infrared spectroscopy for chemical analysis in elec..:

, In: 2022 IEEE 9th Electronics System-Integration Technology Conference (ESTC),
Niegisch, Corinna ; Haag, Sabine ; Braun, Tanja.. - p. 336-342 , 2022
 
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8

Panel Level Packaging – Where are the Technology Limits?:

, In: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC),
Braun, Tanja ; Holck, Ole ; Obst, Mattis... - p. 807-818 , 2022
 
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15

Simulation of experimentally observed dilation phenomena du..:

Hölck, Ole ; Heuchel, Matthias ; Böhning, Martin.
Journal of Polymer Science Part B: Polymer Physics.  46 (2007)  1 - p. 59-71 , 2007
 
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