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Hüser, Dorothee
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1

Precision of diamond turning sinusoidal structures as measu..:

Hüser, Dorothee ; Meeß, Rudolf ; Dai, Gaoliang...
Surface Topography: Metrology and Properties.  12 (2024)  1 - p. 015014 , 2024
Link: https://doi.org/10.1088/..
 
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2

Intercomparison to validate implementations of different la..:

Hüser, Dorothee ; Seewig, Jörg ; Volk, Raimund...
Surface Topography: Metrology and Properties.  12 (2024)  3 - p. 035008 , 2024
Link: https://doi.org/10.1088/..
 
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3

Traceable determination of the size of nanoparticles up to ..:

Hüser, Dorothee ; Bergmann, Detlef ; Klein, Tobias
Measurement Science and Technology.  34 (2023)  8 - p. 085016 , 2023
Link: https://doi.org/10.1088/..
 
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4

Metrological Protocols for Reaching Reliable and SI-Traceab..:

Feltin, Nicolas ; Crouzier, Loïc ; Delvallée, Alexandra...
Nanomaterials.  13 (2023)  6 - p. 993 , 2023
Link: https://doi.org/10.3390/..
 
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5

A Novel Measurement Standard for Surface Roughness on Invol..:

Steinmeyer, Felix ; Hüser, Dorothee ; Meeß, Rudolf.
Applied Sciences.  11 (2021)  21 - p. 10303 , 2021
Link: https://doi.org/10.3390/..
 
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6

Simple method to determine linearity deviations of topograp..:

Bauer, Wilfried ; Hüser, Dorothee ; Gerbert, David
Precision Engineering.  64 (2020)  - p. 243-248 , 2020
Link: https://doi.org/10.1016/..
 
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7

RkRk material measure: A model based design:

Seewig, Jörg ; Eifler, Matthias ; Hüser, Dorothee.
tm - Technisches Messen.  86 (2019)  9 - p. 478-486 , 2019
Link: https://doi.org/10.1515/..
 
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8

Silicon microcavity arrays with open access and a finesse o..:

Wachter, Georg ; Kuhn, Stefan ; Minniberger, Stefan...
Light: Science & Applications.  8 (2019)  1 - p. , 2019
Link: https://doi.org/10.1038/..
 
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9

Electrical discharges caused by opening contacts in an igni..:

Uber, Carsten ; Hilbert, Michael ; Felgner, Andre...
Journal of Loss Prevention in the Process Industries.  61 (2019)  - p. 114-121 , 2019
Link: https://doi.org/10.1016/..
 
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10

Corrigendum to 'Geometry distortions of nanostructure edges..:

Hüser, Dorothee ; Häßler-Grohne, Wolfgang ; Hüser, Jonathan
Measurement Science and Technology.  28 (2017)  10 - p. 109501 , 2017
Link: https://doi.org/10.1088/..
 
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11

Procedure to approximately estimate the uncertainty of mate..:

Hüser, Dorothee ; Hüser, Jonathan ; Rief, Sebastian..
Measurement Science and Technology.  27 (2016)  8 - p. 085005 , 2016
Link: https://doi.org/10.1088/..
 
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12

Uncertainty of Cutting Edge Roughness Estimation Depending ..:

Hüser, Dorothee ; Thomsen-Schmidt, Peter ; Meeß, Rudolf
Procedia CIRP.  45 (2016)  - p. 263-266 , 2016
Link: https://doi.org/10.1016/..
 
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13

Geometry distortions of nanostructure edges scanned with am..:

Hüser, Dorothee ; Häßler-Grohne, Wolfgang ; Hüser, Jonathan
Measurement Science and Technology.  24 (2013)  11 - p. 115008 , 2013
Link: https://doi.org/10.1088/..
 
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14

Kraftmikroskopie durch Einzelpunktantastung an Strukturkant..:

Hüser, Dorothee ; Häßler-Grohne, Wolfgang ; Katzer, Klaus-Dieter...
tm - Technisches Messen.  79 (2012)  12 - p. 542-548 , 2012
Link: https://doi.org/10.1524/..
 
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15

Development of a 3D-AFM for true 3D measurements of nanostr..:

Dai, Gaoliang ; Häßler-Grohne, Wolfgang ; Hüser, Dorothee...
Measurement Science and Technology.  22 (2011)  9 - p. 094009 , 2011
Link: https://doi.org/10.1088/..
 
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