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Haddab, Y.
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1

An open-source and easily replicable hardware for Electrica..:

Brazey, B. ; Haddab, Y. ; Zemiti, N...
HardwareX.  11 (2022)  - p. e00278 , 2022
Link: https://doi.org/10.1016/..
 
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2

Robotic microassembly and micromanipulation at FEMTO-ST:

Agnus, J. ; Chaillet, N. ; Clévy, C....
Journal of Micro-Bio Robotics.  8 (2013)  2 - p. 91-106 , 2013
Link: https://doi.org/10.1007/..
 
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3

Noise characterization in millimeter sized micromanipulatio..:

Boudaoud, M. ; Haddab, Y. ; Le Gorrec, Y..
Mechatronics.  21 (2011)  6 - p. 1087-1097 , 2011
Link: https://doi.org/10.1016/..
 
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4

Improvement of strain gauges micro-forces measurement using..:

Haddab, Y. ; Chen, Q. ; Lutz, P.
Mechatronics.  19 (2009)  4 - p. 457-462 , 2009
Link: https://doi.org/10.1016/..
 
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5

Reliability and stability of GaAs-based pseudomorphic quant..:

Haddab, Y. ; Mosser, V. ; Kobbi, F..
Microelectronics Reliability.  40 (2000)  8-10 - p. 1443-1447 , 2000
Link: https://doi.org/10.1016/..
 
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6

A non-plate like Hall Sensor:

Randjelovic, Z ; Pauchard, A ; Haddab, Y.
Sensors and Actuators A: Physical.  76 (1999)  1-3 - p. 293-297 , 1999
Link: https://doi.org/10.1016/..
 
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7

Observation of dopant–vacancy defects by low-frequency nois..:

Haddab, Y ; Friedrich, A.P ; Popovic, R.S
Solid-State Electronics.  43 (1999)  2 - p. 413-416 , 1999
Link: https://doi.org/10.1016/..
 
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8

Quantized current jumps in silicon photoconductors at room ..:

Haddab, Y. ; Besse, P.-A. ; Popovic, R. S.
Journal of Applied Physics.  86 (1999)  7 - p. 3787-3791 , 1999
Link: https://doi.org/10.1063/..
 
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9

Persistent photoconductivity as a tool for monitoring oxide..:

Haddab, Y. ; Manic, D. ; Popovic, R.S.
Microelectronics Reliability.  38 (1998)  4 - p. 511-514 , 1998
Link: https://doi.org/10.1016/..
 
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10

Persistent photoconductivity in silicon wafers:

Haddab, Y ; Popovic, R S
Semiconductor Science and Technology.  13 (1998)  11 - p. 1294-1297 , 1998
Link: https://doi.org/10.1088/..
 
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11

On-wafer heating tests to study stability of silicon device:

Manic, D. ; Haddab, Y. ; Popovic, R.S.
Microelectronics Reliability.  38 (1998)  6-8 - p. 1069-1073 , 1998
Link: https://doi.org/10.1016/..
 
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12

An on-wafer test structure to measure the effect of thermal..:

Haddab, Y. ; Manic, D. ; Popovic, R.S.
Microelectronics Reliability.  37 (1997)  10-11 - p. 1441-1444 , 1997
Link: https://doi.org/10.1016/..
 
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13

Drain current dlts analysis of recoverable and permanent de..:

Meneghesso, G. ; Haddab, Y. ; Perrino, N...
Microelectronics Reliability.  36 (1996)  11-12 - p. 1895-1898 , 1996
Link: https://doi.org/10.1016/..
 
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14

Optimum channel thickness of Al0.3Ga0.7As/In0.25Ga0.75As/Ga..:

Haddab, Y. ; Bonard, J.-M. ; Haacke, S..
Journal of Applied Physics.  80 (1996)  11 - p. 6309-6314 , 1996
Link: https://doi.org/10.1063/..
 
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15

Carrier trapping in ultrafast metal-semiconductor-metal pho..:

Hugi, J. ; Haddab, Y. ; Sachot, R..
Journal of Applied Physics.  77 (1995)  4 - p. 1785-1794 , 1995
Link: https://doi.org/10.1063/..
 
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