I agree that this site is using cookies. You can find further informations
here
.
X
Login
My folder (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
Show Desktop-Version
Toggle navigation
Haddab, Y.
25
results:
Search for persons
X
Format
Online (25)
Mediatypes
Articles (Online) (21)
OpenAccess-fulltext (4)
Languages
english (22)
german (1)
Sorted by: Relevance
Sorted by: Year
?
1
An open-source and easily replicable hardware for Electrica..:
Brazey, B.
;
Haddab, Y.
;
Zemiti, N.
..
HardwareX. 11 (2022) - p. e00278 , 2022
Link:
https://doi.org/10.1016/..
?
2
Robotic microassembly and micromanipulation at FEMTO-ST:
Agnus, J.
;
Chaillet, N.
;
Clévy, C.
...
Journal of Micro-Bio Robotics. 8 (2013) 2 - p. 91-106 , 2013
Link:
https://doi.org/10.1007/..
?
3
Noise characterization in millimeter sized micromanipulatio..:
Boudaoud, M.
;
Haddab, Y.
;
Le Gorrec, Y.
.
Mechatronics. 21 (2011) 6 - p. 1087-1097 , 2011
Link:
https://doi.org/10.1016/..
?
4
Improvement of strain gauges micro-forces measurement using..:
Haddab, Y.
;
Chen, Q.
;
Lutz, P.
Mechatronics. 19 (2009) 4 - p. 457-462 , 2009
Link:
https://doi.org/10.1016/..
?
5
Reliability and stability of GaAs-based pseudomorphic quant..:
Haddab, Y.
;
Mosser, V.
;
Kobbi, F.
.
Microelectronics Reliability. 40 (2000) 8-10 - p. 1443-1447 , 2000
Link:
https://doi.org/10.1016/..
?
6
A non-plate like Hall Sensor:
Randjelovic, Z
;
Pauchard, A
;
Haddab, Y
.
Sensors and Actuators A: Physical. 76 (1999) 1-3 - p. 293-297 , 1999
Link:
https://doi.org/10.1016/..
?
7
Observation of dopant–vacancy defects by low-frequency nois..:
Haddab, Y
;
Friedrich, A.P
;
Popovic, R.S
Solid-State Electronics. 43 (1999) 2 - p. 413-416 , 1999
Link:
https://doi.org/10.1016/..
?
8
Quantized current jumps in silicon photoconductors at room ..:
Haddab, Y.
;
Besse, P.-A.
;
Popovic, R. S.
Journal of Applied Physics. 86 (1999) 7 - p. 3787-3791 , 1999
Link:
https://doi.org/10.1063/..
?
9
Persistent photoconductivity as a tool for monitoring oxide..:
Haddab, Y.
;
Manic, D.
;
Popovic, R.S.
Microelectronics Reliability. 38 (1998) 4 - p. 511-514 , 1998
Link:
https://doi.org/10.1016/..
?
10
Persistent photoconductivity in silicon wafers:
Haddab, Y
;
Popovic, R S
Semiconductor Science and Technology. 13 (1998) 11 - p. 1294-1297 , 1998
Link:
https://doi.org/10.1088/..
?
11
On-wafer heating tests to study stability of silicon device:
Manic, D.
;
Haddab, Y.
;
Popovic, R.S.
Microelectronics Reliability. 38 (1998) 6-8 - p. 1069-1073 , 1998
Link:
https://doi.org/10.1016/..
?
12
An on-wafer test structure to measure the effect of thermal..:
Haddab, Y.
;
Manic, D.
;
Popovic, R.S.
Microelectronics Reliability. 37 (1997) 10-11 - p. 1441-1444 , 1997
Link:
https://doi.org/10.1016/..
?
13
Drain current dlts analysis of recoverable and permanent de..:
Meneghesso, G.
;
Haddab, Y.
;
Perrino, N.
..
Microelectronics Reliability. 36 (1996) 11-12 - p. 1895-1898 , 1996
Link:
https://doi.org/10.1016/..
?
14
Optimum channel thickness of Al0.3Ga0.7As/In0.25Ga0.75As/Ga..:
Haddab, Y.
;
Bonard, J.-M.
;
Haacke, S.
.
Journal of Applied Physics. 80 (1996) 11 - p. 6309-6314 , 1996
Link:
https://doi.org/10.1063/..
?
15
Carrier trapping in ultrafast metal-semiconductor-metal pho..:
Hugi, J.
;
Haddab, Y.
;
Sachot, R.
.
Journal of Applied Physics. 77 (1995) 4 - p. 1785-1794 , 1995
Link:
https://doi.org/10.1063/..
1-15