Hagedorn, S.
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1

Silicon diffusion in AlN:

Bonito Oliva, V. ; Mangelinck, D. ; Hagedorn, S....
Journal of Applied Physics.  134 (2023)  9 - p. , 2023
 
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2

Using a Mixed-method Approach to Identify Urban Mobility Ne..:

, In: 2023 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM),
Riesener, M. ; Kuhn, M. ; Mertens, M.... - p. 1088-1092 , 2023
 
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6

Structural and luminescence imaging and characterisation of..:

Trager-Cowan, C ; Alasmari, A ; Avis, W...
Semiconductor Science and Technology.  35 (2020)  5 - p. 054001 , 2020
 
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7

Advances in electron channelling contrast imaging and elect..:

Trager-Cowan, C ; Alasmari, A ; Avis, W...
IOP Conference Series: Materials Science and Engineering.  891 (2020)  1 - p. 012023 , 2020
 
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11

Degradation of AlGaN-based metal-semiconductor-metal photod..:

Brendel, M. ; Hagedorn, S. ; Brunner, F....
Japanese Journal of Applied Physics.  58 (2019)  SC - p. SCCC21 , 2019
 
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12

Influence of template properties and quantum well number on..:

Jeschke, J ; Martens, M ; Hagedorn, S...
Semiconductor Science and Technology.  33 (2018)  3 - p. 035015 , 2018
 
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