Hahm, Kai
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1

Precision of diamond turning sinusoidal structures as measu..:

Hüser, Dorothee ; Meeß, Rudolf ; Dai, Gaoliang...
Surface Topography: Metrology and Properties.  12 (2024)  1 - p. 015014 , 2024
 
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5

Accurate tip characterization in critical dimension atomic ..:

Dai, Gaoliang ; Xu, Linyan ; Hahm, Kai
Measurement Science and Technology.  31 (2020)  7 - p. 074011 , 2020
 
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6

Comparison of line width calibration using critical dimensi..:

Dai, Gaoliang ; Hahm, Kai ; Bosse, Harald.
Measurement Science and Technology.  28 (2017)  6 - p. 065010 , 2017
 
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7

Measurements of CD and sidewall profile of EUV photomask st..:

Dai, Gaoliang ; Hahm, Kai ; Scholze, Frank...
Measurement Science and Technology.  25 (2014)  4 - p. 044002 , 2014
 
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9

The Future of Veteran Community Engagement: Perspectives on..:

Chavez, Margeaux Alana ; Blevins, Kai River ; Brown, Christopher...
https://account.journal-veterans-studies.org/index.php/vt-j-jvs/article/view/360/394.  , 2022
 
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