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2023 IEEE International Reliability Physics Symposium (IRPS) ,
3
Soft- and Hard-Error Radiation Reliability of 228 KB $3\mat..:
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2022 International Electron Devices Meeting (IEDM) ,
5
A c-axis aligned crystalline IGZO FET and a 0.06-μm2 HfO2-b..:
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2021 IEEE International Electron Devices Meeting (IEDM) ,
6
Novel Analog in-Memory Compute with > 1 nA Current/Cell and..:
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2019 19th International Workshop on Junction Technology (IWJT) ,
13