Han, Cheng-Yu
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2

Power-Supply-Noise-Aware Timing Analysis and Test Pattern R..:

HAN, Cheng-Yu ; LI, Yu-Ching ; KAN, Hao-Tien.
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences.  E99.A (2016)  12 - p. 2320-2327 , 2016
 
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3

A Flexible TFT Circuit Yield Optimizer Considering Process ..:

Wei, Wen-En ; Li, Hung-Yi ; Han, Cheng-Yu...
Journal of Display Technology.  10 (2014)  12 - p. 1055-1063 , 2014
 
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12

Guaranteed confidence region characterization for source lo..:

Han, Cheng-Yu ; Kieffer, Michel ; Lambert, Alain
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sigpro.2018.03.018.  , 2018
 
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13

Guaranteed confidence region characterization for source lo..:

Han, Cheng-Yu ; Kieffer, Michel ; Lambert, Alain
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sigpro.2018.03.018.  , 2018
 
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