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2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) ,
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Poly-Si Unetch Failure Due to Etching Rate Dependence of Si..:
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MultiMedia Modeling; Lecture Notes in Computer Science ,
12
Visual Question Generation Under Multi-granularity Cross-Mo..:
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Lecture Notes in Computer Science; Machine Learning and Knowledge Discovery in Databases: Applied Data Science and Demo Track ,
13
PDF-VQA: A New Dataset for Real-World VQA on PDF Documents:
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Proceedings of the Sixteenth ACM International Conference on Web Search and Data Mining ,
14
PiggyBack: Pretrained Visual Question Answering Environment..:
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Proceedings of the 32nd ACM International Conference on Information and Knowledge Management ,
15