Search for persons
X
?
2023 IEEE 9th International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA) ,
2
Paddy Yield Monitoring System:
, In:
?
Applied Problems Solved by Information Technology and Software; SpringerBriefs in Applied Sciences and Technology ,
6
The Application of Technology Organization Environment Fram..:
, In:
?
Lecture Notes in Electrical Engineering; Advances in Intelligent Manufacturing and Mechatronics ,
8