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Havelund, R.
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1

Quantifying SIMS of Organic Mixtures and Depth Profiles—Cha..:

Seah, M. P. ; Havelund, R. ; Spencer, S. J..
Journal of the American Society for Mass Spectrometry.  30 (2018)  2 - p. 309-320 , 2018
Link: https://doi.org/10.1007/..
 
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2

SIMS of Organic Materials—Interface Location in Argon Gas C..:

Havelund, R. ; Seah, M. P. ; Tiddia, M..
Journal of the American Society for Mass Spectrometry.  29 (2018)  4 - p. 774-785 , 2018
Link: https://doi.org/10.1007/..
 
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3

Inorganic material profiling using Arn+ cluster: Can we ach..:

Conard, T. ; Fleischmann, C. ; Havelund, R....
Applied Surface Science.  444 (2018)  - p. 633-641 , 2018
Link: https://doi.org/10.1016/..
 
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4

SIMS of Delta Layers in Organic Materials: Amount of Substa..:

Seah, M. P. ; Havelund, R. ; Gilmore, I. S.
The Journal of Physical Chemistry C.  120 (2016)  46 - p. 26328-26335 , 2016
Link: https://doi.org/10.1021/..
 
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5

Sampling Depths, Depth Shifts, and Depth Resolutions for Bi..:

Havelund, R. ; Seah, M. P. ; Gilmore, I. S.
The Journal of Physical Chemistry B.  120 (2016)  9 - p. 2604-2611 , 2016
Link: https://doi.org/10.1021/..
 
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6

Determination of the sputtering yield of cholesterol using ..:

Rakowska, P. D. ; Seah, M. P. ; Vorng, J.-L...
The Analyst.  141 (2016)  16 - p. 4893-4901 , 2016
Link: https://doi.org/10.1039/..
 
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7

Sputtering Yields for Mixtures of Organic Materials Using A..:

Seah, M. P. ; Havelund, R. ; Shard, A. G..
The Journal of Physical Chemistry B.  119 (2015)  42 - p. 13433-13439 , 2015
Link: https://doi.org/10.1021/..
 
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8

Depth resolution at organic interfaces sputtered by argon g..:

Seah, M. P. ; Spencer, S. J. ; Havelund, R...
The Analyst.  140 (2015)  19 - p. 6508-6516 , 2015
Link: https://doi.org/10.1039/..
 
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9

G‐SIMS analysis of organic solar cell materials:

Franquet, A. ; Fleischmann, C. ; Conard, T....
Surface and Interface Analysis.  46 (2014)  S1 - p. 96-99 , 2014
Link: https://doi.org/10.1002/..
 
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10

Fundamental aspects of Arn+ SIMS profiling of common organi..:

Fleischmann, C. ; Conard, T. ; Havelund, R....
Surface and Interface Analysis.  46 (2014)  S1 - p. 54-57 , 2014
Link: https://doi.org/10.1002/..
 
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11

Improving Secondary Ion Mass Spectrometry C60n+ Sputter Dep..:

Havelund, R. ; Licciardello, A. ; Bailey, J....
Analytical Chemistry.  85 (2013)  10 - p. 5064-5070 , 2013
Link: https://doi.org/10.1021/..
 
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12

ZTTK syndrome: Clinical and molecular findings of 15 cases ..:

Kushary, Sulagna Tina ; Revah‐Politi, Anya ; Barua, Subit...
American Journal of Medical Genetics Part A.  185 (2021)  12 - p. 3740-3753 , 2021
Link: https://doi.org/10.1002/..
 
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13

Intracellular Drug Uptake—A Comparison of Single Cell Measu..:

Newman, Carla F. ; Havelund, Rasmus ; Passarelli, Melissa K....
Analytical Chemistry.  89 (2017)  22 - p. 11944-11953 , 2017
Link: https://doi.org/10.1021/..
 
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14

Correction to Measuring Compositions in Organic Depth Profi..:

Shard, Alexander G. ; Havelund, Rasmus ; Spencer, Steve J....
The Journal of Physical Chemistry B.  119 (2015)  44 - p. 14337-14337 , 2015
Link: https://doi.org/10.1021/..
 
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15

3D ToF-SIMS Imaging of Polymer Multilayer Films Using Argon..:

Bailey, James ; Havelund, Rasmus ; Shard, Alexander G....
ACS Applied Materials & Interfaces.  7 (2015)  4 - p. 2654-2659 , 2015
Link: https://doi.org/10.1021/..
 
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