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He, Xiusi
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Electrostatic Discharge Parameter Prediction based on DALST..:

, In: 2023 IEEE 7th International Symposium on Electromagnetic Compatibility (ISEMC),
He, Xiusi ; Ruan, Fangming ; Xu, Kai. - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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2

Analysis of Discharge Parameters Influenced by Electrode Ve..:

, In: 2022 IEEE 16th International Conference on Anti-counterfeiting, Security, and Identification (ASID),
He, Xiusi ; Ruan, Fangming ; Yin, Lan... - p. 134-138 , 2022
Link: https://doi.org/10.1109/..
 
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