He, Yufu
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1

Degradation Behavior of SiC Trench MOSFETs by Total-Ionizin..:

, In: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Chen, Zhengjia ; Xu, Hongyi ; He, Yufu... - p. 228-231 , 2024
 
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2

Neuronal ferroptosis and ferroptosis-mediated endoplasmic r..:

Zhong, PeiPei ; Li, Lingling ; Feng, Xinyi...
International Immunopharmacology.  138 (2024)  - p. 112579 , 2024
 
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3

Single-Event Effects in SiC Power MOSFET Induced by Pulsed-..:

, In: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Ji, Manyi ; He, Yufu ; Xu, Hongyi... - p. 180-183 , 2024
 
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4

Heavy Ion-Induced Damage in SiC Power MOSFETs with differen..:

, In: 2023 2nd International Conference on Advanced Electronics, Electrical and Green Energy (AEEGE),
He, Yufu ; Xu, Hongyi ; Ren, Na. - p. 36-40 , 2023
 
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8

High‐performance tetraphenylethene‐containing poly (p‐pheny..:

Wu, Bing ; Gao, Yufu ; Zhang, Wenlong.
Journal of Polymer Science.  62 (2024)  11 - p. 2539-2548 , 2024
 
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10

Improvement of Rice Blast Resistance in TGMS Line HD9802S t..:

Chen, Pingli ; Gao, Guanjun ; Lou, Guangming...
International Journal of Molecular Sciences.  24 (2023)  19 - p. 14446 , 2023
 
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14

Risk Factor Analysis and Prediction of Severe Hypocalcemia ..:

He, Chenchen ; Zhang, Yibing ; Li, Longfei...
International Journal of Endocrinology.  2023 (2023)  - p. 1-9 , 2023
 
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