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2024 IEEE European Test Symposium (ETS) ,
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Time and Space Optimized Storage-based BIST under Multiple ..:
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2024 IEEE 25th Latin American Test Symposium (LATS) ,
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Vmin Testing under Variations: Defect vs. Fault Coverage:
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2023 IEEE International Test Conference (ITC) ,
3
Robust Pattern Generation for Small Delay Faults Under Proc..:
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2023 IEEE European Test Symposium (ETS) ,
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Approximate Communication: Balancing Performance, Power, Re..:
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2023 IEEE 32nd Asian Test Symposium (ATS) ,
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Optimizing the Streaming of Sensor Data with Approximate Co..:
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2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W) ,
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Low Power Streaming of Sensor Data Using Gray Code-Based Ap..:
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2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ,
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Variation-Aware Test for Logic Interconnects using Neural N..:
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2020 IEEE 38th VLSI Test Symposium (VTS) ,
9
Dynamic Multi-Frequency Test Method for Hidden Interconnect..:
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2020 IEEE International Test Conference (ITC) ,
10
Logic Fault Diagnosis of Hidden Delay Defects:
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2019 IEEE International Test Conference (ITC) ,
11
A Hybrid Space Compactor for Adaptive X-Handling:
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2017 22nd IEEE European Test Symposium (ETS) / general chair: Maria K. Michael (University of Cyprus, CY)
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ETS 2017 foreword:
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