Herrera, Luis A.
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6

A Probabilistic Approach to Series Arc Fault Detection and ..:

Gajula, Kaushik ; Le, Vu ; Yao, Xiu..
IEEE Journal of Emerging and Selected Topics in Industrial Electronics.  5 (2024)  1 - p. 27-38 , 2024
 
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TechLean: Value-added model for process optimization and au..:

, In: 2023 IEEE Colombian Caribbean Conference (C3),
 
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14

Model Based Change Detection Approach For Sensor Fault Iden..:

, In: NAECON 2023 - IEEE National Aerospace and Electronics Conference,
 
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