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Herzinger, Craig M.
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1

Mueller matrix imaging microscope using dual continuously r..:

Ruder, Alexander ; Wright, Brandon ; Feder, Rene...
Optics Express.  29 (2021)  18 - p. 28704 , 2021
Link: https://doi.org/10.1364/..
 
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2

Mueller matrix ellipsometer using dual continuously rotatin..:

Ruder, Alexander ; Wright, Brandon ; Peev, Darin...
Optics Letters.  45 (2020)  13 - p. 3541 , 2020
Link: https://doi.org/10.1364/..
 
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3

Terahertz to Mid-infrared Dielectric Properties of Polymeth..:

Park, Serang ; Li, Yanzeng ; Fullager, Daniel B....
Journal of Infrared, Millimeter, and Terahertz Waves.  40 (2019)  9 - p. 971-979 , 2019
Link: https://doi.org/10.1007/..
 
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4

Optical constants of electroplated gold from spectroscopic ..:

Synowicki, R.A. ; Herzinger, Craig M. ; Hall, James T..
Applied Surface Science.  421 (2017)  - p. 824-830 , 2017
Link: https://doi.org/10.1016/..
 
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5

Estimating Depolarization with the Jones Matrix Quality Fac..:

Hilfiker, James N. ; Hale, Jeffrey S. ; Herzinger, Craig M....
Applied Surface Science.  421 (2017)  - p. 494-499 , 2017
Link: https://doi.org/10.1016/..
 
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6

Magneto-optical properties of cobalt slanted columnar thin ..:

Schmidt, Daniel ; Hofmann, Tino ; Herzinger, Craig M...
Applied Physics Letters.  96 (2010)  9 - p. , 2010
Link: https://doi.org/10.1063/..
 
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7

Refractive indices and band-gap properties of rocksalt MgxZ..:

Schmidt-Grund, Rüdiger ; Carstens, Anke ; Rheinländer, Bernd...
Journal of Applied Physics.  99 (2006)  12 - p. , 2006
Link: https://doi.org/10.1063/..
 
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8

Far-infrared magnetooptic generalized ellipsometry: determi..:

Schubert, Mathias ; Hofmann, Tino ; Herzinger, Craig M.
Thin Solid Films.  455-456 (2004)  - p. 563-570 , 2004
Link: https://doi.org/10.1016/..
 
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9

Precision in ellipsometrically determined sample parameters..:

Johs, Blaine ; Herzinger, Craig M.
Thin Solid Films.  455-456 (2004)  - p. 66-71 , 2004
Link: https://doi.org/10.1016/..
 
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10

Generalized far-infrared magneto-optic ellipsometry for sem..:

Schubert, Mathias ; Hofmann, Tino ; Herzinger, Craig M.
Journal of the Optical Society of America A.  20 (2003)  2 - p. 347 , 2003
Link: https://doi.org/10.1364/..
 
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11

Extension of rotating-analyzer ellipsometry to generalized ..:

Schubert, Mathias ; Woollam, John A. ; Johs, Blaine..
Journal of the Optical Society of America A.  13 (1996)  4 - p. 875 , 1996
Link: https://doi.org/10.1364/..
 
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12

Generalized transmission ellipsometry for twisted biaxial d..:

Schubert, Mathias ; Cramer, Christiane ; Woollam, John A....
Journal of the Optical Society of America A.  13 (1996)  9 - p. 1930 , 1996
Link: https://doi.org/10.1364/..
 
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13

Piezo-optical response of Si1−yCy alloys grown pseudomorphi..:

Zollner, Stefan ; Herzinger, Craig M. ; Woollam, John A....
Solid State Communications.  96 (1995)  5 - p. 305-308 , 1995
Link: https://doi.org/10.1016/..
 
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14

Optical constants of GaxIn1−xP lattice matched to GaAs:

Schubert, Mathias ; Gottschalch, V. ; Herzinger, Craig M....
Journal of Applied Physics.  77 (1995)  7 - p. 3416-3419 , 1995
Link: https://doi.org/10.1063/..
 
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15

Computation, visualization, and animation of infrared Muell..:

Carrieri, Arthur H. ; Schmitt, Charles Jeffrey ; Herzinger, Craig M..
Applied Optics.  32 (1993)  31 - p. 6264 , 1993
Link: https://doi.org/10.1364/..
 
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