Search for persons
X
?
2024 IEEE 74th Electronic Components and Technology Conference (ECTC) ,
1
Monitoring of wafer thinning induced in-die mechanical stre..:
, In:
?
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
2
Monitoring Product Chip Health with In-die Quality Monitors:
, In:
?
2023 IEEE International Reliability Physics Symposium (IRPS) ,
6
In-Product BTI Aging Sensor for Reliability Screening and E..:
, In:
?
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) ,
8
DFI Filler Cells – New Embedded Type of Test Structures for..:
, In:
?
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC) ,
9