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Hilfiker, James N.
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1

Erratum: "Excellent conformality of atmospheric-pressure pl..:

van de Poll, Mike L. ; Jain, Hardik ; Hilfiker, James N....
Applied Physics Letters.  123 (2023)  24 - p. , 2023
Link: https://doi.org/10.1063/..
 
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2

Excellent conformality of atmospheric-pressure plasma-enhan..:

van de Poll, Mike L. ; Jain, Hardik ; Hilfiker, James N....
Applied Physics Letters.  123 (2023)  18 - p. , 2023
Link: https://doi.org/10.1063/..
 
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3

Mueller matrix spectroscopic ellipsometry:

Hilfiker, James N. ; Hong, Nina ; Schoeche, Stefan
Advanced Optical Technologies.  11 (2022)  3-4 - p. 59-91 , 2022
Link: https://doi.org/10.1515/..
 
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4

Mesomorphic Ceramic Films Synthesized via Lyotropic Self-As..:

Zhang, Wenshi ; Chen, Shaw H. ; Hilfiker, James N..
ACS Applied Nano Materials.  3 (2020)  11 - p. 10605-10611 , 2020
Link: https://doi.org/10.1021/..
 
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5

Natural optical activity as the origin of the large chiropt..:

Wade, Jessica ; Hilfiker, James N. ; Brandt, Jochen R....
Nature Communications.  11 (2020)  1 - p. , 2020
Link: https://doi.org/10.1038/..
 
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6

Multi‐instrument characterization of HiPIMS and DC magnetro..:

Roychowdhury, Tuhin ; Shah, Dhruv ; Jain, Varun...
Surface and Interface Analysis.  52 (2020)  7 - p. 433-441 , 2020
Link: https://doi.org/10.1002/..
 
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7

Spectroscopic ellipsometry characterization of multilayer o..:

Hilfiker, James N. ; Pribil, Greg K. ; Synowicki, Ron..
Surface and Coatings Technology.  357 (2019)  - p. 114-121 , 2019
Link: https://doi.org/10.1016/..
 
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8

Robust Extraction of Hyperbolic Metamaterial Permittivity U..:

Zhang, Cheng ; Hong, Nina ; Ji, Chengang...
ACS Photonics.  5 (2018)  6 - p. 2234-2242 , 2018
Link: https://doi.org/10.1021/..
 
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9

Calibration of a multi-pass photoacoustic spectrometer cell..:

Bluvshtein, Nir ; Flores, J. Michel ; He, Quanfu...
Atmospheric Measurement Techniques.  10 (2017)  3 - p. 1203-1213 , 2017
Link: https://doi.org/10.5194/..
 
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10

Spectroscopic ellipsometry characterization of coatings on ..:

Hilfiker, James N. ; Pietz, Brandon ; Dodge, Bill...
Applied Surface Science.  421 (2017)  - p. 500-507 , 2017
Link: https://doi.org/10.1016/..
 
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11

Determining thickness and refractive index from free-standi..:

Hilfiker, James N. ; Stadermann, Michael ; Sun, Jianing...
Applied Surface Science.  421 (2017)  - p. 508-512 , 2017
Link: https://doi.org/10.1016/..
 
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12

Estimating Depolarization with the Jones Matrix Quality Fac..:

Hilfiker, James N. ; Hale, Jeffrey S. ; Herzinger, Craig M....
Applied Surface Science.  421 (2017)  - p. 494-499 , 2017
Link: https://doi.org/10.1016/..
 
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13

Mueller matrix characterization of flexible plastic substra..:

Hong, Nina ; Synowicki, Ron A. ; Hilfiker, James N.
Applied Surface Science.  421 (2017)  - p. 518-528 , 2017
Link: https://doi.org/10.1016/..
 
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14

Spectroscopic ellipsometry: practical application to thin f.. 

Materials characterization and analysis collection
Tompkins, Harland G ; Hilfiker, James N , 2016
Link: https://search.ebscohost..
 
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15

Extension of Far UV spectroscopic ellipsometry studies of H..:

Kamineni, Vimal K. ; Hilfiker, James N. ; Freeouf, John L....
Thin Solid Films.  519 (2011)  9 - p. 2894-2898 , 2011
Link: https://doi.org/10.1016/..
 
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