Hitit, Oguz Kagan
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1

Ion Count-Aided Microscopy for Quantitative, Shot Noise-Mit..:

Agarwal, Akshay ; Kasaei, Leila ; He, Xinglin...
Microscopy and Microanalysis.  30 (2024)  Supplement_1 - p. , 2024
 
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2

Shot noise-mitigated secondary electron imaging with ion co..:

Agarwal, Akshay ; Kasaei, Leila ; He, Xinglin...
Proceedings of the National Academy of Sciences.  121 (2024)  31 - p. , 2024
 
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3

Fourier-ring Correlation Resolution for Time-resolved Measu..:

Hitit, Oguz Kagan ; Agarwal, Akshay ; Goyal, Vivek
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 730-731 , 2023
 
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