Ho, H Y
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1

A Novel Program-verify Free and Low Drift Multilevel Operat..:

, In: 2024 IEEE International Memory Workshop (IMW),
Chien, W. C. ; Sung, C. L. ; Bruce, R. L.... - p. 1-4 , 2024
 
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2

SMARTPHONE LEVEL INDOOR/OUTDOOR UBIQUITOUS PEDESTRIAN POSIT..:

Ho, H.-Y. ; Ng, H.-F. ; Leung, Y.-T....
The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences.  XLVIII-1/W1-2023 (2023)  - p. 175-182 , 2023
 
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3

A Comprehensive Study on the Pillar Size of OTS-PCM Memory ..:

, In: 2023 IEEE International Memory Workshop (IMW),
Chien, W.C. ; Lai, E.K. ; Buzi, L.... - p. 1-4 , 2023
 
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4

COST-EFFECTIVE CAMERA LOCALIZATION AIDED BY PRIOR POINT CLO..:

Leung, Y.-T. ; Zheng, X. ; Ho, H.-Y...
The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences.  XLVIII-1/W1-2023 (2023)  - p. 227-234 , 2023
 
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5

Device Study on OTS-PCM for Persistent Memory Application :..:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Chien, W. C. ; Gignac, L. M. ; Chou, Y. C.... - p. 327-329 , 2022
 
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6

Optimizing AsSeGe Chalcogenides by Dopants for Extremely Lo..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Cheng, H. Y. ; Chien, W C. ; Kuo, I. T.... - p. 28.6.1-28.6.4 , 2021
 
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7

Si Incorporation Into AsSeGe Chalcogenides for High Thermal..:

, In: 2020 IEEE Symposium on VLSI Technology,
Cheng, H. Y. ; Kuo, I. T. ; Chien, W C.... - p. 1-2 , 2020
 
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8

Effect of Sintering Temperature on Thermoelectric Propertie..:

Sie, F. R. ; Hwang, C. S. ; Tang, Y. H....
Journal of Electronic Materials.  44 (2014)  6 - p. 1450-1455 , 2014
 
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10

Thermoelectric Performance of Bi0.5Sb1.5Te3/Sb Composites F..:

Sie, F. R. ; Hwang, C. S. ; Kuo, C. H....
Journal of Electronic Materials.  44 (2014)  6 - p. 1498-1503 , 2014
 
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11

The relationship between heavy metal exposure and risk of i..:

Ho, H.-Y. ; Wei, H.-J.
Fertility and Sterility.  100 (2013)  3 - p. S12 , 2013
 
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