E-LIB Suche - Ergebnisse für: Hoffmann, Raik

1

Enhanced reliability and trapping behavior in ferroelectric..:

, In: 2024 IEEE International Memory Workshop (IMW),

Lederer, Maximilian ; Muller, Franz ; Hoffmann, Raik... - p. 1-4 , 2024

Link: https://doi.org/10.1109/..

2

Lattice Scattering Related Flicker Noise in Silicon-Doped H..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),

Hessler, Daniel ; Olivo, Ricardo ; Seidel, Konrad... - p. 1-2 , 2024

Link: https://doi.org/10.1109/..

3

Improvement of low-frequency noise behavior with chloridic ..:

Hessler, Daniel ; Olivo, Ricardo ; Baldauf, Tim...
Memories - Materials, Devices, Circuits and Systems. 7 (2024) - p. 100095 , 2024

Link: https://doi.org/10.1016/..

4

Dopant-Dependent Flicker Noise of Hafnium Oxide Ferroelectr..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),

Hessler, Daniel ; Olivo, Ricardo ; Seidel, Konrad... - p. 1-3 , 2024

Link: https://doi.org/10.1109/..

5

Integration of ferroelectric devices for advanced in-memory..:

Seidel, Konrad ; Lehninger, David ; Sünbül, Ayse...
Japanese Journal of Applied Physics. 63 (2024) 5 - p. 050802 , 2024

Link: https://doi.org/10.35848..

6

Ferroelectric Field Effect Transistors–Based Content‐Addres..:

Sunil, Athira ; Rana SK, Masud ; Lederer, Maximilian...
Advanced Intelligent Systems. 6 (2024) 4 - p. , 2024

Link: https://doi.org/10.1002/..

7

Improved Endurance Reliability of Ferroelectric Hafnium Oxi..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Sunbul, Ayse ; Lehninger, David ; Hoffmann, Raik... - p. 1-5 , 2024

Link: https://doi.org/10.1109/..

8

Multilevel Operation of Ferroelectric FET Memory Arrays Con..:

Müller, Franz ; De, Sourav ; Olivo, Ricardo...
IEEE Electron Device Letters. 44 (2023) 5 - p. 757-760 , 2023

Link: https://doi.org/10.1109/..

9

300 mm CMOS-compatible superconducting HfN and ZrN thin fil..:

Potjan, Roman ; Wislicenus, Marcus ; Ostien, Oliver...
Applied Physics Letters. 123 (2023) 17 - p. , 2023

Link: https://doi.org/10.1063/..

10

Thermoelectric transport properties of Si, SiGe, and silici..:

Schwinge, Caroline ; Hoffmann, Raik ; Hertel, Johannes...
Review of Scientific Instruments. 94 (2023) 10 - p. , 2023

Link: https://doi.org/10.1063/..

11

A Ferroelectric BEoL Module: Adding Non-Volatile Memories a..:

, In: 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM),

Seidel, Konrad ; Lehninger, David ; Abdulazhanov, Sukhrob... - p. 1-3 , 2023

Link: https://doi.org/10.1109/..

12

Multi-Level Operation of Ferroelectric FET Memory Arrays fo..:

, In: 2023 IEEE International Memory Workshop (IMW),

Muller, Franz ; De, Sourav ; Lederer, Maximilian... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

13

A Study on Imprint Behavior of Ferroelectric Hafnium Oxide ..:

Sünbül, Ayse ; Lehninger, David ; Lederer, Maximilian...
physica status solidi (a). 220 (2023) 7 - p. , 2023

Link: https://doi.org/10.1002/..

14

Interfacial Layer Engineering to Enhance Noise Immunity of ..:

, In: 2022 International Conference on IC Design and Technology (ICICDT),

Raffel, Yannick ; Thunder, Sunanda ; Lederer, Maximilian... - p. 8-11 , 2022

Link: https://doi.org/10.1109/..

15

Synergistic Approach of Interfacial Layer Engineering and R..:

Raffel, Yannick ; De, Sourav ; Lederer, Maximilian...
ACS Applied Electronic Materials. 4 (2022) 11 - p. 5292-5300 , 2022

Link: https://doi.org/10.1021/..