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Holleman, Jisk
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1

Influence of Interface Recombination in Light Emission from..:

LeMinh, Phuong ; Hoang, Tu ; Holleman, Jisk.
ECS Transactions.  3 (2007)  33 - p. 23-29 , 2007
Link: https://doi.org/10.1149/..
 
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2

Langmuir-probe Characterization of an Inductively-Coupled R..:

Boogaard, Arjen ; Kovalgin, Alexey ; Aarnink, Tom...
ECS Transactions.  2 (2007)  7 - p. 181-191 , 2007
Link: https://doi.org/10.1149/..
 
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3

On the Verification of EEDFs in Plasmas with Silane using O..:

Boogaard, Arjen ; Kovalgin, Alexey ; Brunets, Ihor...
ECS Transactions.  6 (2007)  1 - p. 259-270 , 2007
Link: https://doi.org/10.1149/..
 
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4

Silicon light-emitting diode antifuse: properties and devic..:

LeMinh, Phuong ; Holleman, Jisk
Journal of Physics D: Applied Physics.  39 (2006)  17 - p. 3749-3754 , 2006
Link: https://doi.org/10.1088/..
 
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5

Influence of Interface Recombination in Light Emission from..:

Hoang, Tu ; LeMinh, Phuong ; Holleman, Jisk.
ECS Transactions.  3 (2006)  11 - p. 9-16 , 2006
Link: https://doi.org/10.1149/..
 
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6

Green Laser Crystallization of a-Si Films Using Preformed a..:

Brunets, Ihor ; Holleman, Jisk ; Kovalgin, Alexey Y....
ECS Transactions.  3 (2006)  8 - p. 185-191 , 2006
Link: https://doi.org/10.1149/..
 
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7

Loading Effects on Kinetical and Electrical Aspects of Sila..:

Holleman, Jisk ; Hasper, Albert ; Kleijn, Chris R.
Journal of The Electrochemical Society.  140 (1993)  3 - p. 818-825 , 1993
Link: https://doi.org/10.1149/..
 
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8

Extraction of Kinetic Parameters for the Chemical Vapor Dep..:

Holleman, Jisk ; Verweij, Jan F.
Journal of The Electrochemical Society.  140 (1993)  7 - p. 2089-2097 , 1993
Link: https://doi.org/10.1149/..
 
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9

Low pressure chemical vapour deposition at quasi-high flow:

Holleman, Jisk ; Middelhoek, Jan
Thin Solid Films.  114 (1984)  3 - p. 295-309 , 1984
Link: https://doi.org/10.1016/..
 
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10

TFTs as photodetectors for optical interconnects:

Rangarajan, Balaji ; Brunets, Ihor ; Holleman, Jisk..
http://doc.utwente.nl/69089/1/rangarajan.pdf.  , 2009
Link: http://purl.utwente.nl/p..
 
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11

Influence of dislocation loops on the near infrared light e..:

Hoang, Tu ; Holleman, Jisk ; LeMinh, Puong...
http://doc.utwente.nl/61858/1/hoang_ted_proofs.pdf.  , 2007
Link: http://purl.utwente.nl/p..
 
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12

Low hydrogen content silicon nitride films deposited at roo..:

Isai, Gratiela I ; Holleman, Jisk ; Wallinga, Hans.
ISSN:0013-4651.  , 2004
Link: http://repository.tue.nl..
 
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13

Low-Pressure CVD of Germanium-Silicon films using Silane an..:

Kovalgin, Alexey ; Holleman, Jisk ; Salm, Cora.
http://doc.utwente.nl/70005/1/kovalgin_tftt_V.pdf.  , 2001
Link: http://purl.utwente.nl/p..
 
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14

Technological and physical compatibilities in hybrid integr..:

Zhou, Ming-Jiang ; Ikkink, Ton ; Chalmers, John...
http://doc.utwente.nl/96420/1/zhou-1994-technological.pdf.  , 1994
Link: http://purl.utwente.nl/p..
 
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15

Loading Effects on Kinetical and Electrical Aspects of Sila..:

Holleman, Jisk ; Hasper, Albert ; Kleijn, Chris R
http://doc.utwente.nl/61613/1/loading.pdf.  , 1993
Link: http://purl.utwente.nl/p..
 
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