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2023 IEEE European Test Symposium (ETS) ,
1
BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-..:
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2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS) ,
2
Exploiting the Error Resilience of the Preconditioned Conju..:
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2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W) ,
4
Guardband Optimization for the Preconditioned Conjugate Gra..:
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2023 IEEE 16th International Symposium on Embedded Multicore/Many-core Systems-on-Chip (MCSoC) ,
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Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filli..:
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2022 IEEE European Test Symposium (ETS) ,
7
On the Impact of Hardware Timing Errors on Stochastic Compu..:
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2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID) ,
10
Power and Energy Safe Real-Time Multi-Core Task Scheduling:
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2020 IEEE International Test Conference (ITC) ,
12
Logic Fault Diagnosis of Hidden Delay Defects:
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2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ,
13
A Fault-Tolerant MPSoC For CubeSats:
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2019 IEEE International Test Conference (ITC) ,
14
Variation-Aware Small Delay Fault Diagnosis on Compressed T..:
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2019 IEEE 24th Pacific Rim International Symposium on Dependable Computing (PRDC) ,
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