Hoseini, Omid
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1

Commercial USB IC Soft-Failure Sensitivity Measurement Meth..:

, In: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI),
Hua, Runbing ; Hoseini, Omid ; Peng, Zhekun... - p. 200-204 , 2020
 
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2

Using beam and ENDB specimens to evaluate fracture characte..:

Hoseini, Seyed Omid ; Mousavi, Seyed Roohollah ; Sohrabi, Mohammad Reza.
Fatigue & Fracture of Engineering Materials & Structures.  46 (2023)  5 - p. 1669-1686 , 2023
 
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6

Machine Learning Voice Synthesis for Intention Electromagne..:

, In: 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium,
 
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8

A New Tunable Damped Sine-like Waveform Generator For IEMI ..:

, In: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI),
 
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9

Analysis Of CPU Loading Effect On ESD Susceptibility:

, In: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI),
 
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10

Measurement of the Amplitude and Phase Response of Harmonic..:

, In: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI),
 
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