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Hosobuchi, Keiichiro
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1

A Scanning Electrostatic Force Microscope for the Measureme..:

, In: Proceedings of the 38th International MATADOR Conference,
Ito, So ; Hosobuchi, Keiichiro ; Jia, Zhigang. - p. 563-571 , 2022
Link: https://doi.org/10.1007/..
 
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2

Metrological investigation of a scanning electrostatic forc..:

Hosobuchi, Keiichiro ; Oertel, Erik ; Manske, Eberhard
Measurement Science and Technology.  , 2021
Link: https://doi.org/10.1088/..
 
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3

Drift reduction in a scanning electrostatic force microscop..:

Jia, Zhigang ; Ito, So ; Goto, Shigeaki...
Measurement Science and Technology.  25 (2014)  9 - p. 094001 , 2014
Link: https://doi.org/10.1088/..
 
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4

Measurement of contact potential difference and material di..:

HOSOBUCHI, Keiichiro ; JIA, Zhigang ; ITO, So..
Journal of Advanced Mechanical Design, Systems, and Manufacturing.  8 (2014)  4 - p. JAMDSM0050-JAMDSM0050 , 2014
Link: https://doi.org/10.1299/..
 
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5

An improved scan mode in an electrostatic force microscope ..:

JIA, Zhigang ; HOSOBUCHI, Keiichiro ; ITO, So..
Journal of Advanced Mechanical Design, Systems, and Manufacturing.  8 (2014)  4 - p. JAMDSM0051-JAMDSM0051 , 2014
Link: https://doi.org/10.1299/..
 
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6

Characterization of electrostatic force for scanning electr..:

Jia, Zhigang ; Ito, So ; Hosobuchi, Keiichiro...
International Journal of Precision Engineering and Manufacturing.  14 (2013)  9 - p. 1543-1549 , 2013
Link: https://doi.org/10.1007/..
 
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7

A noncontact scanning electrostatic force microscope for su..:

Gao, Wei ; Goto, Shigeaki ; Hosobuchi, Keiichiro..
CIRP Annals.  61 (2012)  1 - p. 471-474 , 2012
Link: https://doi.org/10.1016/..
 
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8

An ultra-precision scanning tunneling microscopeZ-scanner f..:

Goto, Shigeaki ; Hosobuchi, Keiichiro ; Gao, Wei
Measurement Science and Technology.  22 (2011)  8 - p. 085101 , 2011
Link: https://doi.org/10.1088/..
 
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9

An improved scan mode in an electrostatic force microscope ..:

Zhigang JIA ; Keiichiro HOSOBUCHI ; So ITO..
https://www.jstage.jst.go.jp/article/jamdsm/8/4/8_2014jamdsm0051/_pdf/-char/en.  , 2014
Link: https://doi.org/10.1299/..
 
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10

Measurement of contact potential difference and material di..:

Keiichiro HOSOBUCHI ; Zhigang JIA ; So ITO..
https://www.jstage.jst.go.jp/article/jamdsm/8/4/8_2014jamdsm0050/_pdf/-char/en.  , 2014
Link: https://doi.org/10.1299/..
 
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