E-LIB Suche - Ergebnisse für: Houdt, J. Van

1

Gate Side Injection Operating Mode for 3D NAND Flash Memori..:

, In: 2024 IEEE International Memory Workshop (IMW),

Breuil, L. ; Izmailov, R. ; Popovici, M.... - p. 1-4 , 2024

Link: https://doi.org/10.1109/..

2

Study of Endurance Performance of SiO$_{\text{2}}$ Interfac..:

Agarwal, A. ; Walke, A. M. ; Ronchi, N...
IEEE Transactions on Electron Devices. , 2024

Link: https://doi.org/10.1109/..

3

Pulse-Based Capacitive Memory Window with High Non-Destruct..:

, In: 2023 International Electron Devices Meeting (IEDM),

Mukherjee, S. ; Bizindavyi, J. ; Luo, Y-C.... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

4

Optimization of Retention in Ferroelectricity Boosted Gate ..:

, In: 2023 IEEE International Memory Workshop (IMW),

Breuil, L. ; Popovici, M. ; Stiers, J.... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

5

Variability in Planar FeFETs—Channel Percolation Impact:

Kaczmarek, K. ; Bardon, M. Garcia ; Xiang, Y....
IEEE Transactions on Electron Devices. 70 (2023) 7 - p. 3928-3934 , 2023

Link: https://doi.org/10.1109/..

6

Impact of Pulse Amplitude on Voltage-Driven Precessional Sw..:

, In: 2023 IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers),

Favaro, D. ; Kim, W. ; Monteiro, M. Gama... - p. 1-2 , 2023

Link: https://doi.org/10.1109/..

7

High performance La-doped HZO based ferroelectric capacitor..:

, In: 2022 International Electron Devices Meeting (IEDM),

Popovici, M.I. ; Bizindavyi, J. ; Favia, P.... - p. 6.4.1-6.4.4 , 2022

Link: https://doi.org/10.1109/..

8

Modelling ultra-fast threshold voltage instabilities in Hf-..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),

O'Sullivan, B. J. ; Truijen, B. ; Putcha, V.... - p. 4A.4-1-4A.4-8 , 2022

Link: https://doi.org/10.1109/..

9

Trap-polarization interaction during low-field trap charact..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),

Truijen, B. ; O'Sullivan, B. ; Alam, Md Nur K.... - p. P12-1-P12-4 , 2022

Link: https://doi.org/10.1109/..

10

S170: DYNAMIC INTERPLAY BETWEEN TUMOR AND MICRO-ENVIRONMENT..:

Köse, M. C. ; Bergiers, I. ; Malfait, M....
HemaSphere. 6 (2022) - p. 71-72 , 2022

Link: https://doi.org/10.1097/..

11

Insight to Data Retention loss in ferroelectric Hf0.5Zr0.5O..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),

Alam, Md Nur K. ; Higashi, Yusuke ; Truijen, B.... - p. 340-342 , 2022

Link: https://doi.org/10.1109/..

12

Impact of ambient temperature on the switching of voltage-c..:

Wu, Y. C. ; Kim, W. ; Van Beek, S....
Applied Physics Letters. 118 (2021) 12 - p. , 2021

Link: https://doi.org/10.1063/..

13

First demonstration of ferroelectric Si:HfO2 based 3D FE-FE..:

, In: 2021 IEEE International Memory Workshop (IMW),

Banerjee, K. ; Breuil, L. ; Milenin, A.P.... - p. 1-4 , 2021

Link: https://doi.org/10.1109/..

14

Analog In-memory Computing in FeFET-based 1T1R Array for Ed..:

, In: 2021 Symposium on VLSI Circuits,

Saito, D. ; Kobayashi, T. ; Koga, H.... - p. 1-2 , 2021

Link: https://doi.org/10.23919..

15

First principles investigation of charge transition levels ..:

Alam, Md Nur K ; Clima, S. ; O'Sullivan, B. J....
Journal of Applied Physics. 129 (2021) 8 - p. , 2021

Link: https://doi.org/10.1063/..