Hsiang-Yun Cheng
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2

ReAIM: A ReRAM-based Adaptive Ising Machine for Solving Com..:

, In: 2024 ACM/IEEE 51st Annual International Symposium on Computer Architecture (ISCA),
 
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3

Imipenem reduces the efficacy of vancomycin against Elizabe..:

Yang, Ya-Sung ; Chen, Hsing-Yu ; Lin, I Chieh...
Journal of Antimicrobial Chemotherapy.  79 (2024)  8 - p. 2048-2052 , 2024
 
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4

Tensor Movement Orchestration in Multi-GPU Training Systems:

, In: 2023 IEEE International Symposium on High-Performance Computer Architecture (HPCA),
Lin, Shao-Fu ; Chen, Yi-Jung ; Cheng, Hsiang-Yun. - p. 1140-1152 , 2023
 
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Special Session - Non-Volatile Memories: Challenges and Opp..:

, In: Proceedings of the International Conference on Compilers, Architecture, and Synthesis for Embedded Systems,
Henkel, Jorg ; Siddhu, Lokesh ; Bauer, Lars... - p. 11-20 , 2023
 
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Retinex Based on Weaken Factor with Truncated AGCWD for Bac..:

, In: 2022 IEEE International Conference on Consumer Electronics (ICCE),
 
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This is SPATEM! A Spatial-Temporal Optimization Framework f..:

, In: 2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC),
Tsou, Yen-Ting ; Chen, Kuan-Hsun ; Yang, Chia-Lin... - p. 702-707 , 2022
 
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Efficient Bad Block Management with Cluster Similarity:

, In: 2022 IEEE International Symposium on High-Performance Computer Architecture (HPCA),
Yen, Jui-Nan ; Hsieh, Yao-Ching ; Chen, Cheng-Yu... - p. 503-513 , 2022
 
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DL-RSIM: A Reliability and Deployment Strategy Simulation F..:

Lin, Wei-Ting ; Cheng, Hsiang-Yun ; Yang, Chia-Lin...
ACM Transactions on Embedded Computing Systems.  21 (2022)  3 - p. 1-29 , 2022
 
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Efficient and Atomic-Durable Persistent Memory through In-P..:

, In: 2022 IEEE 11th Non-Volatile Memory Systems and Applications Symposium (NVMSA),
 
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GraphRSim: A Joint Device-Algorithm Reliability Analysis fo..:

, In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Nien, Chin-Fu ; Hsiao, Yi-Jou ; Cheng, Hsiang-Yun... - p. 1478-1483 , 2020
 
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14

GraphRSim : a joint device-algorithm reliability analysi..:

, In: Proceedings of the 23rd Conference on Design, Automation and Test in Europe,
Nien, Chin-Fu ; Hsiao, Yi-Jou ; Cheng, Hsiang-Yun... - p. 1478-1483 , 2020
 
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