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Proceedings of the 57th ACM/EDAC/IEEE Design Automation Conference ,
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Realistic fault models and fault simulation for quantum dot..:
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2020 IEEE International Test Conference in Asia (ITC-Asia) ,
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High Efficiency and Low Overkill Testing for Probabilistic ..:
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2020 IEEE International Test Conference (ITC) ,
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qATG: Automatic Test Generation for Quantum Circuits:
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2020 57th ACM/IEEE Design Automation Conference (DAC) ,
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