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Hsu, Chun-Lung
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1

Wafer Defect Pattern Labeling and Recognition Using Semi-Su..:

Li, Katherine Shu-Min ; Jiang, Xu-Hao ; Chen, Leon Li-Yang...
IEEE Transactions on Semiconductor Manufacturing.  35 (2022)  2 - p. 291-299 , 2022
Link: https://doi.org/10.1109/..
 
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2

Surface EMG vs. High-Density EMG: Tradeoff Between Performa..:

Sugiarto, Tommy ; Hsu, Chun-Lung ; Sun, Chi-Tien...
IEEE Access.  9 (2021)  - p. 45418-45427 , 2021
Link: https://doi.org/10.1109/..
 
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3

Fault-Aware Dependability Enhancement Techniques for Phase ..:

Lu, Shyue-Kung ; Li, Hui-Ping ; Miyase, Kohei..
Journal of Electronic Testing.  37 (2021)  4 - p. 503-513 , 2021
Link: https://doi.org/10.1007/..
 
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4

Testing of in-memory-computing memories with 8 T SRAMs:

Tsai, Tsai-Ling ; Li, Jin-Fu ; Hsu, Chun-Lung.
Microelectronics Reliability.  123 (2021)  - p. 114215 , 2021
Link: https://doi.org/10.1016/..
 
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5

Testing of Configurable 8T SRAMs for In-Memory Computing:

, In: 2020 IEEE 29th Asian Test Symposium (ATS),
Li, Jin-Fu ; Tsai, Tsai-Ling ; Hsu, Chun-Lung. - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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6

Head-Orientation-Prediction Based on Deep Learning on sEMG ..:

, In: 2020 Fourth IEEE International Conference on Robotic Computing (IRC),
Sugiarto, Tommy ; Hsu, Chun-Lung ; Sun, Chi-Tien... - p. 183-186 , 2020
Link: https://doi.org/10.1109/..
 
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7

Fault-Aware Dependability Enhancement Techniques for Flash ..:

Lu, Shyue-Kung ; Yu, Shu-Chi ; Hsu, Chun-Lung...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  28 (2020)  3 - p. 634-645 , 2020
Link: https://doi.org/10.1109/..
 
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8

Fault-Aware ECC Techniques for Reliability Enhancement of F..:

, In: 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT),
Lu, Shyue-Kung ; Tsai, Zeng-Long ; Hsu, Chun-Lung. - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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9

ECC Caching Techniques for Protecting NAND Flash Memories:

, In: 2020 IEEE International Test Conference in Asia (ITC-Asia),
Lu, Shyue-Kung ; Tsai, Zeng-Long ; Hsu, Chun-Lung. - p. 47-52 , 2020
Link: https://doi.org/10.1109/..
 
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10

Low-Power Hardware Architecture for Depthwise Separable Con..:

, In: 2020 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan),
Lin, Shi-Rou ; Lin, Wei-Hung ; Huang, Shih-Hsu.. - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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11

A Built-in Self-Test Scheme for TSVs of Logic-DRAM Stacked ..:

, In: 2019 International 3D Systems Integration Conference (3DIC),
Yang, Wei-Hsuan ; Li, Jin-Fu ; Hsu, Chun-Lung.. - p. 1-3 , 2019
Link: https://doi.org/10.1109/..
 
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12

Testing of In-Memory-Computing 8T SRAMs:

, In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Tsai, Tsai-Ling ; Li, Jin-Fu ; Hsu, Chun-Lung. - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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13

Testing stuck-open faults of priority address encoder in co..:

, In: Proceedings of the 24th Asia and South Pacific Design Automation Conference,
Tsai, Tsai-Ling ; Li, Jin-Fu ; Hsu, Chun-Lung. - p. 347-351 , 2019
Link: https://dl.acm.org/doi/1..
 
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14

Retention-Aware Refresh Techniques for Reducing Power and M..:

Lu, Shyue-Kung ; Huang, Hung-Kai ; Hsu, Chun-Lung..
Journal of Electronic Testing.  35 (2019)  4 - p. 485-495 , 2019
Link: https://doi.org/10.1007/..
 
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15

Testing Stuck-Open Faults of Priority Address Encoder in Co..:

, In: 2019 24th Asia and South Pacific Design Automation Conference (ASP-DAC),
Tsai, Tsai-Ling ; Li, Jin-Fu ; Hsu, Chun-Lung. - p. 1-5 , 2019
Link: https://doi.org/10.1145/..
 
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