Hsu, Jeff Chia-Kai
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8

Comprehensive Study of Contact Length Scaling Down to 12 nm..:

Wu, Wen-Chia ; Hung, Terry Y. T. ; Sathaiya, D. Mahaveer...
IEEE Transactions on Electron Devices.  70 (2023)  12 - p. 6680-6686 , 2023
 
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Scaled contact length with low contact resistance in monola..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
 
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11

The Role of Nonapoptotic Programmed Cell Death — Ferroptosi..:

Sheng-Kai Hsu ; Yi-Hsuan Chu ; Wun-Jyun Syue...
https://www.frontiersin.org/articles/10.3389/fonc.2022.872883/full.  , 2022
 
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