Hsu, Wei-You
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1

High-strength and high-conductivity nanotwinned Cu lightly ..:

Lee, Kang-Ping ; Chen, Bo-Yan ; Lin, Yi-Quan...
Materials Science and Engineering: A.  891 (2024)  - p. 145990 , 2024
 
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2

Non-TCB Process Cu/SiO2 Hybrid Bonding Using Plasma-free Hy..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Chen, Yu-An ; Ong, Jia-Juen ; Chiu, Wei-Lan... - p. 399-403 , 2024
 
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3

Characterization of Surface Activation on Nanotwinned Coppe..:

, In: 2024 International Conference on Electronics Packaging (ICEP),
Lee, Rou-Jun ; He, Pin-Syuan ; Chiu, Wei-Lan... - p. 77-78 , 2024
 
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4

High toughness of nanotwinned copper lines after annealing:

Hsu, Wei-You ; Tran, Dinh-Phuc ; Li, Yu-Jin.
Materials Science and Engineering: A.  887 (2023)  - p. 145749 , 2023
 
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5

Electroless-deposition of epitaxial (111)-oriented silver o..:

Tseng, Hsiang-Hou ; Lan, Man-Chi ; Hsu, Wei-You...
Journal of Materials Research and Technology.  27 (2023)  - p. 7957-7963 , 2023
 
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8

Highly Selective Electrochemical Reduction of CO2 into Meth..:

Cai, Jin ; Zhao, Qing ; Hsu, Wei-You...
Journal of the American Chemical Society.  145 (2023)  16 - p. 9136-9143 , 2023
 
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10

Distribution of elastic stress as a function of temperature..:

Hsu, Wei-You ; Tseng, I-Hsin ; Chiang, Ching-Yu..
Journal of Materials Research and Technology.  20 (2022)  - p. 2799-2808 , 2022
 
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12

Effect of Electroplating Current Density on Tensile Propert..:

Fang, Chuan-Yu ; Tran, Dinh-Phuc ; Liu, Hung-Che...
Journal of The Electrochemical Society.  169 (2022)  4 - p. 042503 , 2022
 
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15

Effect of annealing on the toughness of 40-μm-wide nanotwin..:

, In: 2020 IEEE 70th Electronic Components and Technology Conference (ECTC),
Hsu, Wei-You ; Li, Yu-Jin ; Tseng, I-Hsin... - p. 906-911 , 2020
 
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