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Hsuesh, Li-Tien
1
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1
A 4H-SiC Trench MOS Capacitor Structure for Sidewall Oxide ..:
, In:
2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)
,
Huang, Huai-Lin
;
Hsuesh, Li-Tien
;
Tu, Yen-Cheng
. - p. 1-5 , 2024
Link:
https://doi.org/10.1109/..
1-1
