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Hu, Vita Pi-Ho
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1

Innovative Recovery Strategy for MFIS-FeFETs at Optimal Tim..:

Wu, Cheng-Hung ; Liu, Jay ; Zheng, Xun-Ting...
IEEE Transactions on Electron Devices.  71 (2024)  5 - p. 3371-3376 , 2024
Link: https://doi.org/10.1109/..
 
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2

Projected performance of Si- and 2D-material-based SRAM cir..:

Lu, Yu-Cheng ; Huang, Jing-Kai ; Chao, Kai-Yuan..
Nature Nanotechnology.  , 2024
Link: https://doi.org/10.1038/..
 
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3

Improved RF Performance with Buried Power Rail and Contact ..:

, In: 2024 IEEE International Symposium on Circuits and Systems (ISCAS),
Chiu, Hao-Chi ; Hu, Vita Pi-Ho - p. 1-5 , 2024
Link: https://doi.org/10.1109/..
 
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4

Improved Radiation Hardness for Nanosheet FETs with Partial..:

, In: 2023 Silicon Nanoelectronics Workshop (SNW),
Zheng, Xun-Ting ; Hu, Vita Pi-Ho - p. 75-76 , 2023
Link: https://doi.org/10.23919..
 
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5

Analysis of Monolithic 3D SRAM with Back-End-of-Line-compat..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
Lu, Yu-Cheng ; Lee, Ming ; Huang, Zi-Yuan. - p. 1-2 , 2023
Link: https://doi.org/10.1109/..
 
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6

Stability and Performance Optimization of 6T SRAM Cell at C..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Fang, Shao-Fu ; Hu, Vita Pi-Ho - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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7

Improved Scalability of Negative Capacitance Junctionless T..:

Gupta, Manish ; Hu, Vita Pi-Ho
IEEE Transactions on Electron Devices.  70 (2023)  8 - p. 4043-4048 , 2023
Link: https://doi.org/10.1109/..
 
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8

Energy-Efficient SRAM with Emerging Technologies:

, In: 2023 International Conference on IC Design and Technology (ICICDT),
Hu, Vita Pi-Ho - p. xxxv-xxxv , 2023
Link: https://doi.org/10.1109/..
 
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9

Variation-Tolerant Ferroelectric FET-based Ternary Content-..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Chuang, Han-Fu ; Hu, Vita Pi-Ho - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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10

Linearity Analysis of FeFET Synaptic Devices considering Ra..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Pan, Yen-Ming ; Lu, Cheng-Kai ; Hu, Vita Pi-Ho - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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11

Sensitivity Analysis of Ferroelectric Junctionless Transist..:

, In: 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Gupta, Manish ; Hu, Vita Pi-Ho - p. 1-2 , 2022
Link: https://doi.org/10.1109/..
 
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12

Variation-Tolerant Recall Operation for Nonvolatile SRAM In..:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Li, Ai-Fang ; Huang, Ruei-Yu ; Hu, Vita Pi-Ho - p. 213-215 , 2022
Link: https://doi.org/10.1109/..
 
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13

Mechanisms of instability retention for ferroelectric field..:

Liao, Chun-Yu ; Lin, Chen-Ying ; Lee, Zhi-Xian...
Applied Physics Letters.  121 (2022)  25 - p. , 2022
Link: https://doi.org/10.1063/..
 
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14

On the thickness dependence of the polarization switching k..:

Sawabe, Yoshiki ; Saraya, Takuya ; Hiramoto, Toshiro...
Applied Physics Letters.  121 (2022)  8 - p. , 2022
Link: https://doi.org/10.1063/..
 
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15

Efficient Erase Operation by GIDL Current for 3D Structure ..:

Mo, Fei ; Xiang, Jiawen ; Mei, Xiaoran...
IEEE Journal of the Electron Devices Society.  10 (2022)  - p. 115-122 , 2022
Link: https://doi.org/10.1109/..
 
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