Hu Xing
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1

Federated Learning for Software Engineering: A Case Study o..:

Yang, Yanming ; Hu, Xing ; Gao, Zhipeng...
IEEE Transactions on Software Engineering.  50 (2024)  2 - p. 296-321 , 2024
 
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2

Ppt4j: Patch Presence Test for Java Binaries:

, In: 2024 IEEE/ACM 46th International Conference on Software Engineering (ICSE),
Pan, Zhiyuan ; Hu, Xing ; Xia, Xin... - p. 2784-2795 , 2024
 
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3

PS3: Precise Patch Presence Test Based on Semantic Symbolic..:

, In: 2024 IEEE/ACM 46th International Conference on Software Engineering (ICSE),
Zhan, Qi ; Hu, Xing ; Li, Zhiyang... - p. 2061-2072 , 2024
 
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4

Learning in the Wild: Towards Leveraging Unlabeled Data for..:

, In: 2024 IEEE/ACM 46th International Conference on Software Engineering (ICSE),
Gao, Shuzheng ; Mao, Wenxin ; Gao, Cuiyun... - p. 969-981 , 2024
 
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5

Post-training quantization for re-parameterization via coar..:

Yang, Dawei ; He, Ning ; Hu, Xing...
Journal of Systems Architecture.  147 (2024)  - p. 103065 , 2024
 
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6

Anion‐Reinforced Solvation Structure Enables Stable Operati..:

Gu, Mengjia ; Zhou, Xunzhu ; Yang, Qian...
Angewandte Chemie International Edition.  63 (2024)  30 - p. , 2024
 
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7

Streamlining Java Programming: Uncovering Well-Formed Idiom..:

, In: Proceedings of the IEEE/ACM 46th International Conference on Software Engineering,
Yang, Yanming ; Hu, Xing ; Xia, Xin.. - p. 1-12 , 2024
 
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11

V-type granular starches prepared by maize starches with di..:

Lai, Sixing ; Xie, Hexiang ; Hu, Hao...
International Journal of Biological Macromolecules.  266 (2024)  - p. 131092 , 2024
 
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12

Exploiting Library Vulnerability via Migration Based Automa..:

, In: 2024 IEEE/ACM 46th International Conference on Software Engineering (ICSE),
Chen, Zirui ; Hu, Xing ; Xia, Xin... - p. 2820-2831 , 2024
 
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13

Easy over Hard: A Simple Baseline for Test Failures Causes ..:

, In: Companion Proceedings of the 32nd ACM International Conference on the Foundations of Software Engineering,
Gao, Zhipeng ; Xue, Zhipeng ; Hu, Xing.. - p. 306-317 , 2024
 
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15

MUT: Human-in-the-Loop Unit Test Migration:

, In: 2024 IEEE/ACM 46th International Conference on Software Engineering (ICSE),
Gao, Yi ; Hu, Xing ; Xu, Tongtong... - p. 2832-2843 , 2024
 
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