Hua, Runbing
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Commercial USB IC Soft-Failure Sensitivity Measurement Meth..:

, In: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI),
Hua, Runbing ; Hoseini, Omid ; Peng, Zhekun... - p. 200-204 , 2020
 
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