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2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
13
RESURF Region Variation Induced Current Crowding Effect on ..:
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2023 IEEE International Solid- State Circuits Conference (ISSCC) ,
14
20.3 A GaN Gate Driver with On-chip Adaptive On-time Contro..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
15