Huang, Jen-Wei
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2

Guest Editorial: AI-eXplained (Part II) [Guest Editorial]:

Chung, Pau-Choo ; Dockhorn, Alexander ; Huang, Jen-Wei
IEEE Computational Intelligence Magazine.  19 (2024)  1 - p. 76-77 , 2024
 
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3

GraphSAGE-Based Spammer Detection Using Social Attribute Re..:

, In: Communications in Computer and Information Science; Technologies and Applications of Artificial Intelligence,
Jin, Bing-Yun ; Li, Shiou-Chi ; Huang, Jen-Wei - p. 300-313 , 2024
 
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4

Advances in Knowledge Discovery and Data Mining: 28th Pacif.. 

Lecture Notes in Artificial Intelligence, 14649
Yang, De-Nian ; Xie, Xing ; Tseng, Vincent S... - 1st ed. 2024 . , 2024
 
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6

Advances in Knowledge Discovery and Data Mining: 28th Pacif.. 

Lecture Notes in Artificial Intelligence, 14645
Yang, De-Nian ; Xie, Xing ; Tseng, Vincent S... - 1st ed. 2024 . , 2024
 
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7

Advances in Knowledge Discovery and Data Mining: 28th Pacif.. 

Lecture Notes in Artificial Intelligence, 14650
Yang, De-Nian ; Xie, Xing ; Tseng, Vincent S... - 1st ed. 2024 . , 2024
 
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8

Advances in Knowledge Discovery and Data Mining: 28th Pacif.. 

Lecture Notes in Artificial Intelligence, 14646
Yang, De-Nian ; Xie, Xing ; Tseng, Vincent S... - 1st ed. 2024 . , 2024
 
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9

Advances in Knowledge Discovery and Data Mining: 28th Pacif.. 

Lecture Notes in Artificial Intelligence, 14648
Yang, De-Nian ; Xie, Xing ; Tseng, Vincent S... - 1st ed. 2024 . , 2024
 
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10

Advances in Knowledge Discovery and Data Mining: 28th Pacif.. 

Lecture Notes in Artificial Intelligence, 14647
Yang, De-Nian ; Xie, Xing ; Tseng, Vincent S... - 1st ed. 2024 . , 2024
 
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11

Let the Information Fly: Reconstructing Social Network Afte..:

Li, Shiou-Chi ; Huang, Jen-Wei
IEEE Transactions on Knowledge and Data Engineering.  36 (2024)  3 - p. 1198-1209 , 2024
 
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12

Geometrically-Aware Dual Transformer Encoding Visual and Te..:

, In: Advances in Knowledge Discovery and Data Mining; Lecture Notes in Computer Science,
Chang, Yu-Ling ; Ma, Hao-Shang ; Li, Shiou-Chi. - p. 15-27 , 2024
 
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13

Analysis of the Extraction Method and Mechanism of Hot Carr..:

Huang, Jen-Wei ; Chen, Po-Hsun ; Yeh, Tsung-Han..
IEEE Transactions on Device and Materials Reliability.  23 (2023)  4 - p. 510-515 , 2023
 
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15

Investigation of Threshold Voltage and Drain Current Degrad..:

Kuo, Hung-Ming ; Chang, Ting-Chang ; Chang, Kai-Chun...
IEEE Transactions on Electron Devices.  70 (2023)  5 - p. 2216-2221 , 2023
 
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