Huang, Shao-Chang
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2

20.3 A GaN Gate Driver with On-chip Adaptive On-time Contro..:

, In: 2023 IEEE International Solid- State Circuits Conference (ISSCC),
Lin, Shu-Yung ; Lin, Ssu-Yu ; Hung, Sheng-Hsi... - p. 306-308 , 2023
 
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3

RESURF Region Variation Induced Current Crowding Effect on ..:

, In: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Lee, Jian-Hsing ; Li, Ching-Ho ; Nidhi, Karuna... - p. 1-7 , 2023
 
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4

Bipolar Transistors' Holding Phenomena:

, In: 2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan),
Huang, Shao-Chang ; Hsu, Kai-Chieh ; Lin, Chih-Hsuan... - p. 221-222 , 2023
 
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5

Monolithic GaN-Based Gate Driver With On-Chip Adaptive On-T..:

Lin, Shu-Yung ; Lin, Ssu-Yu ; Hung, Sheng-Hsi...
IEEE Solid-State Circuits Letters.  6 (2023)  - p. 217-220 , 2023
 
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6

Optimizing Device Metal Routing Layouts by the Simulation T..:

, In: 2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan),
Huang, Shao-Chang ; Li, Ching-Ho ; Liao, Chih-Cherng... - p. 219-220 , 2023
 
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7

30.8 3D Wireless Power Transfer with Noise Cancellation Tec..:

, In: 2023 IEEE International Solid- State Circuits Conference (ISSCC),
Huang, Fei ; Tsai, Hsing-Yen ; Huang, Chi-Yu... - p. 452-454 , 2023
 
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8

A Combination of Implant Shadow and Skin Effects Leading to..:

, In: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
 
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9

Transmission Line Pulse Width Impacting on Device Performan..:

, In: 2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan),
 
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11

A Concise Electrothermal Model to Characterize the Thermal ..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
 
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12

Study on 20 V LDMOS With Stepped-Gate-Oxide Structure for P..:

Chen, Sue-Yi ; Liao, Benjamin ; Dong, Jia-Ching...
IEEE Transactions on Electron Devices.  69 (2022)  2 - p. 878-881 , 2022
 
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13

Optimizing 20V LDNMOS Transistors for PMIC Applications by ..:

, In: 2022 IEEE International Conference on Consumer Electronics - Taiwan,
Chen, Sue-Yi ; Peng, Yin-Wei ; Dong, Jia-Ching... - p. 361-362 , 2022
 
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14

Reducing Large LDNMOSFET Substrate Currents by Modifying Is..:

, In: 2022 IEEE International Conference on Consumer Electronics - Taiwan,
Chen, Sue-Yi ; Huang, Shao-Chang ; Hsu, Kai-Chieh... - p. 77-78 , 2022
 
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15

Gate Voltages Impacting on Latch-up Measurements:

, In: 2022 IEEE International Conference on Consumer Electronics - Taiwan,
 
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