Huang-Chung Cheng, Huang-Chung Cheng
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2

Charging Damages to Gate Oxides in a Helicon O2 Plasma:

Lin, Wendy ; Kang, Tzong-Kuei ; Perng, Yean-Chyi..
Japanese Journal of Applied Physics.  36 (1997)  12R - p. 7362 , 1997
 
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3

Fabrication and Characterization of the Pd-Silicided Emitte..:

Wang, Chih-Chong ; Ku, Tzu-Kun ; Hsieh, Iing-Jar.
Japanese Journal of Applied Physics.  35 (1996)  6R - p. 3681 , 1996
 
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5

Excellent Emission Characteristics of Tunneling Oxides Form..:

Wang, Ping-Wei ; Ku, Tzu-Kun ; Su, Huan-Ping..
Japanese Journal of Applied Physics.  35 (1996)  6R - p. 3369 , 1996
 
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6

High-Performance Au/Ti/Ge/Pd Ohmic Contacts on n-Type In 0...:

Chai, Chun-Yi ; Wu, Janne-Wha ; Guo, Jan-Dar...
Japanese Journal of Applied Physics.  35 (1996)  4R - p. 2073 , 1996
 
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7

Excellent Au/Ge/Pd Ohmic Contacts to n-type GaAs Using Mo/T..:

Chai, Chun-Yi ; Huang, Jung-A ; Lai, Yong-Lin...
Japanese Journal of Applied Physics.  35 (1996)  4R - p. 2110 , 1996
 
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9

Effects of Polysilicon Electron Cyclotron Resonance Etching..:

Kang, Tzong-Kuei ; Ueng, Shih-Yuan ; Dai, Bau-Tong..
Japanese Journal of Applied Physics.  34 (1995)  5R - p. 2272 , 1995
 
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10

Electrical Characteristics of Thin-Film Transistors with Do..:

Tsai, Meng-Jin ; Wang, Ping-Wei ; Su, Huan-Ping.
Japanese Journal of Applied Physics.  34 (1995)  2R - p. 470 , 1995
 
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12

A New Fabrication Technology for Field-Emission Triodes wit..:

Wang, Chih-Chong ; Lee, Wen-Fang ; Ku, Tze-Kun...
Japanese Journal of Applied Physics.  34 (1995)  1A - p. L85 , 1995
 
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14

Simulation of the Electrical Characteristics of Field Emiss..:

Ku, Tzu-Kun ; Chen, Ming-Shang ; Wang, Chih-Chong...
Japanese Journal of Applied Physics.  34 (1995)  10R - p. 5789 , 1995
 
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15

Energy Dependence of the Electron-Capture Cross Section of ..:

Chen, Yeong E. ; Wang, Fang Shing ; Tsai, Jun Wei.
Japanese Journal of Applied Physics.  34 (1995)  2B - p. L268 , 1995
 
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