E-LIB Suche - Ergebnisse für: Huard, V.

1

Correlation Technologies for OTA Testing of mmWave Mobile D..:

, In: 2022 IEEE Radio and Wireless Symposium (RWS),

Wane, S. ; Dinh, T.V. ; Tran, Q.H.... - p. 68-71 , 2022

Link: https://doi.org/10.1109/..

2

Spintronics Technology Solutions for Interferometric Therma..:

, In: 2022 IEEE Texas Symposium on Wireless and Microwave Circuits and Systems (WMCS),

Wane, S. ; Tran, Q.H. ; Dinh, T.V.... - p. 1-6 , 2022

Link: https://doi.org/10.1109/..

3

Energy-Efficient RF-Optics Multi-Beam Systems Using Correla..:

, In: 2022 IEEE Texas Symposium on Wireless and Microwave Circuits and Systems (WMCS),

Wane, S. ; Ferrero, F. ; Sombrin, J.... - p. 1-6 , 2022

Link: https://doi.org/10.1109/..

4

Correlation Technologies for OTA Testing of Mobile Devices:..:

, In: 2021 IEEE Conference on Antenna Measurements & Applications (CAMA),

Wane, S. ; Ferrero, F. ; Dinh, T.V.... - p. 235-239 , 2021

Link: https://doi.org/10.1109/..

5

Industrial best practice: cases of study by automotive chip..:

, In: 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),

Abbati, L. Degli ; Ullmann, R. ; Paganini, G.... - p. 1-6 , 2021

Link: https://doi.org/10.1109/..

6

P118: Impact des bêtabloquants pour les patients souffrant ..:

Cournoyer, A. ; Soucy-Legault, J. ; Frégeau, A....
CJEM. 22 (2020) S1 - p. S107-S108 , 2020

Link: https://doi.org/10.1017/..

7

Broadband Smart mmWave Front-End-Modules in Advanced FD-SOI..:

, In: 2020 IEEE Texas Symposium on Wireless and Microwave Circuits and Systems (WMCS),

Wane, S. ; Huard, V. ; Rack, M.... - p. 1-5 , 2020

Link: https://doi.org/10.1109/..

8

mmWave Dual-Beam Phased-Arrays including Down-Conversion wi..:

, In: 2020 IEEE Texas Symposium on Wireless and Microwave Circuits and Systems (WMCS),

Wane, S. ; Kieniewicz, B. ; Yeap, E.... - p. 1-5 , 2020

Link: https://doi.org/10.1109/..

9

MP55: Characteristics associated with biphasic reactions in..:

Lachance, A. ; Ben-shoshan, M. ; Cournoyer, A....
CJEM. 21 (2019) S1 - p. S62 , 2019

Link: https://doi.org/10.1017/..

10

Characterization of Low Drop-Out during ageing and design f..:

Lajmi, R. ; Cacho, F. ; Lauga Larroze, E....
Microelectronics Reliability. 76-77 (2017) - p. 92-96 , 2017

Link: https://doi.org/10.1016/..

11

Enabling robust automotive electronic components in advance..:

Huard, V. ; Mhira, S. ; Cacho, F..
Microelectronics Reliability. 76-77 (2017) - p. 13-24 , 2017

Link: https://doi.org/10.1016/..

12

Potentiality of healing techniques in hot-carrier damaged 2..:

Bravaix, A. ; Cacho, F. ; Federspiel, X....
Microelectronics Reliability. 64 (2016) - p. 163-167 , 2016

Link: https://doi.org/10.1016/..

13

Performance vs. reliability adaptive body bias scheme in 28..:

Ndiaye, C. ; Huard, V. ; Federspiel, X...
Microelectronics Reliability. 64 (2016) - p. 158-162 , 2016

Link: https://doi.org/10.1016/..

14

Digital circuits reliability with in-situ monitors in 28nm ..:

, In: Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition,

Saliva, M. ; Cacho, F. ; Huard, V.... - p. 441-446 , 2015

Link: https://dl.acm.org/doi/1..

15

Direct measurement of the dynamic variability of 0.120µm2 S..:

, In: 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers,

El Husseini, J. ; Garros, X. ; Subirats, A.... - p. 1-2 , 2014

Link: https://doi.org/10.1109/..