Huawei, Li
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1

Assembly Line Detection Based on Dynamic Programming for Ch..:

, In: Proceedings of the 6th International Conference on Electrical Engineering and Information Technologies for Rail Transportation (EITRT) 2023; Lecture Notes in Electrical Engineering,
Yupeng, Duan ; Huawei, Li ; Jin, Chai. - p. 680-687 , 2024
 
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2

Behavior of a novel corrugated grouted sleeve splice for pr..:

Wei, Muwang ; Jinru, Du ; Huawei, Li...
Advances in Structural Engineering.  26 (2023)  7 - p. 1353-1374 , 2023
 
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3

Intelligent Device For Sea Surface Cleaning:

, In: 2022 IEEE 5th Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC),
Aocheng, Liu ; Xueming, Zhu ; Fenghua, Wang... - p. 467-471 , 2022
 
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4

Crop exposure to waterlogging stress: responses to physiolo..:

, In: Sustainable Crop Productivity and Quality Under Climate Change,
Huawei, Li ; Shouwei, Han ; Weibao, Yu... - p. 59-72 , 2022
 
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5

Design of Hybrid Energy System of CRH2 Train Passing Throug..:

, In: 2022 4th Global Power, Energy and Communication Conference (GPECOM),
 
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6

List of contributors:

, In: Sustainable Crop Productivity and Quality Under Climate Change,
Abasi, Fozia ; Ahmad, Khawaja Shafique ; Bai, Chenyang... - p. xiii-xvii , 2022
 
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7

Research on Reliability of Grid Connected Photovoltaic Rene..:

Qadeer, Abdul ; Huawei, Li ; Ikram, Muhammad Talha
IOP Conference Series: Earth and Environmental Science.  804 (2021)  3 - p. 032058 , 2021
 
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8

Selection of suitable reference genes for RT-qPCR normalisa..:

GuoLiang, Li ; Guochun, Xu ; Zhaomiao, Lin...
The Journal of Horticultural Science and Biotechnology.  96 (2020)  2 - p. 209-219 , 2020
 
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9

Scriptural Reasoning as a Method of Interreligious Dialogue..:

Huawei, Li ; Ruokanen, Miikka ; Ford, David
International Review of Mission.  108 (2019)  2 - p. 415-429 , 2019
 
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10

Innovative practices session 10C formal verification practi..:

, In: 2017 IEEE 35th VLSI Test Symposium (VTS),
Huawei Li ; Xiaowei Li - p. 1-1 , 2017
 
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11

On Topology Reconfiguration for Defect-Tolerant NoC-Based H..:

Lei Zhang ; Yinhe Han ; Qiang Xu..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  17 (2009)  9 - p. 1173-1186 , 2009
 
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12

Embedded Test Decompressor to Reduce the Required Channels ..:

Han, Y. ; Yu Hu ; Xiaowei Li..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  15 (2007)  5 - p. 531-540 , 2007
 
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13

Advanced topics of DFT technologies in a general purposed C..:

, In: ASIC, 2003. Proceedings. 5th International Conference on,
 
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14

Bit-Trimmer: Ineffectual Bit-Operation Removal for CLM Arch..:

, In: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE),
He, Yintao ; Zhao, Shixin ; Qu, Songyun... - p. 1-6 , 2024
 
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