E-LIB Suche - Ergebnisse für: Hubbard, William A.

1

Weld-free mounting of lamellae for electrical biasing opera..:

Recalde-Benitez, Oscar ; Pivak, Yevheniy ; Jiang, Tianshu...
Ultramicroscopy. 260 (2024) - p. 113939 , 2024

2

Mapping Conductivity in the TEM with SEEBIC:

Hubbard, William A ; Chan, Ho Leung ; Regan, B C
Microscopy and Microanalysis. 29 (2023) Supplement_1 - p. 1851-1852 , 2023

Link: https://doi.org/10.1093/..

3

Operando two-terminal devices inside a transmission electro..:

Recalde-Benitez, Oscar ; Jiang, Tianshu ; Winkler, Robert...
Communications Engineering. 2 (2023) 1 - p. , 2023

Link: https://doi.org/10.1038/..

4

Emission-Based Temperature Mapping with STEM EBIC:

Hubbard, William A ; Mecklenburg, Matthew ; Chan, Ho Leung.
Microscopy and Microanalysis. 29 (2023) Supplement_1 - p. 1608-1609 , 2023

Link: https://doi.org/10.1093/..

5

Juvenile Atlantic sea scallop, Placopecten magellanicus, en..:

Pousse, Emilien ; Poach, Matthew E. ; Redman, Dylan H....
PLOS Climate. 2 (2023) 2 - p. e0000142 , 2023

Link: https://doi.org/10.1371/..

6

A Low-Noise, Two-Channel STEM EBIC Metrology System:

Hubbard, William A ; Mecklenburg, Matthew ; Regan, B C
Microscopy and Microanalysis. 28 (2022) S1 - p. 794-795 , 2022

Link: https://doi.org/10.1017/..

7

Determining the Polarization Fraction of Thin Film Ferroele..:

Chan, Ho Leung ; Fields, Shelby S ; O'Neill, Tristan...
Microscopy and Microanalysis. 28 (2022) S1 - p. 2270-2271 , 2022

Link: https://doi.org/10.1017/..

8

Nanoscale Conductivity Mapping: Live Imaging of Dielectric ..:

, In: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),

Hubbard, William A. ; Lodico, Jared J. ; Chan, Ho Leung.. - p. 1-4 , 2022

Link: https://doi.org/10.1109/..

9

Imaging Dielectric Breakdown in Valence Change Memory (Adv...:

Hubbard, William A. ; Lodico, Jared J. ; Chan, Ho Leung..
Advanced Functional Materials. 32 (2022) 2 - p. , 2022

Link: https://doi.org/10.1002/..

10

Separation of EBIC Modes with Two-Channel STEM EBIC:

Hubbard, William A ; Chan, Ho Leung ; Mecklenburg, Matthew.
Microscopy and Microanalysis. 28 (2022) S1 - p. 2508-2509 , 2022

Link: https://doi.org/10.1017/..

11

InAsP Quantum Dot-Embedded InP Nanowires toward Silicon Pho..:

Chang, Ting-Yuan ; Kim, Hyunseok ; Hubbard, William A....
ACS Applied Materials & Interfaces. 14 (2022) 10 - p. 12488-12494 , 2022

Link: https://doi.org/10.1021/..

12

In Situ Visualization of the Electron Wind Force in the Ela..:

Mecklenburg, Matthew ; Zutter, Brian ; Hubbard, William A...
Microscopy and Microanalysis. 27 (2021) S1 - p. 106-107 , 2021

Link: https://doi.org/10.1017/..

13

Mapping Charge Recombination and the Effect of Point-Defect..:

Zutter, Brian T. ; Kim, Hyunseok ; Hubbard, William A....
Physical Review Applied. 16 (2021) 4 - p. , 2021

Link: https://doi.org/10.1103/..

14

Visualizing the Electron Wind Force in the Elastic Regime:

Mecklenburg, Matthew ; Zutter, Brian T. ; Ling, Xin Yi..
Nano Letters. 21 (2021) 24 - p. 10172-10177 , 2021

Link: https://doi.org/10.1021/..

15

Imaging Soft and Hard Dielectric Breakdown in Resistive Swi..:

Regan, B. C. ; Lodico, Jared ; Chan, Ho Leung..
Microscopy and Microanalysis. 27 (2021) S1 - p. 2354-2355 , 2021

Link: https://doi.org/10.1017/..