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Hung, Chien Chung
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1

Negative Bias Temperature Instability on Subthreshold Swing..:

Yen, Cheng Tyng ; Hung, Hsiang Ting ; Hung, Chien Chung...
Materials Science Forum.  897 (2017)  - p. 533-536 , 2017
Link: https://doi.org/10.4028/..
 
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2

Negative Bias Temperature Instability of SiC MOSFET:

Yen, Cheng Tyng ; Hung, Hsiang Ting ; Hung, Chien Chung...
Materials Science Forum.  858 (2016)  - p. 595-598 , 2016
Link: https://doi.org/10.4028/..
 
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3

Effect of Fixed Oxide Charges and Donor-Like Interface Trap..:

Yen, Cheng Tyng ; Hung, Hsiang Ting ; Hung, Chien Chung...
Materials Science Forum.  821-823 (2015)  - p. 729-732 , 2015
Link: https://doi.org/10.4028/..
 
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4

SiC Epi-Channel Lateral MOSFETs:

Yen, Cheng Tyng ; Bakowski, Mietek ; Hung, Chien Chung...
Materials Science Forum.  778-780 (2014)  - p. 927-930 , 2014
Link: https://doi.org/10.4028/..
 
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5

Comparative Study of 4H-SiC DMOSFETs with N2O Thermal Oxide..:

Yen, Cheng Tyng ; Hung, Chien Chung ; Mikhaylov, Aleksey...
Materials Science Forum.  778-780 (2014)  - p. 989-992 , 2014
Link: https://doi.org/10.4028/..
 
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6

Simulation and Optimization of 4H-SiC DMOSFET Power Transis..:

Hung, Chien Chung ; Chen, Young Shying ; Yen, Cheng Tyng...
Materials Science Forum.  740-742 (2013)  - p. 711-714 , 2013
Link: https://doi.org/10.4028/..
 
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7

Performance Comparison of GaN Power Transistors and Investi..:

Lee, Chwan Ying ; Chen, Yung Hsiang ; Lee, Lurng Shehng...
Materials Science Forum.  717-720 (2012)  - p. 1303-1306 , 2012
Link: https://doi.org/10.4028/..
 
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8

Radiation Influence Comparison between SiC JMOS and DMOS:

, In: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Hsu, Fu-Jen ; Hung, Chien-Chung ; Chu, Kuo-Ting... - p. 146-149 , 2020
Link: https://doi.org/10.1109/..
 
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9

Design Consideration of Low Capacitance SiC JMOS for Adapti..:

, In: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Hsu, Fu-Jen ; Hung, Chien-Chung ; Chu, Kuo-Ting... - p. 122-125 , 2020
Link: https://doi.org/10.1109/..
 
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10

Short-Circuit Ruggedness Analysis of SiC JMOS and DMOS:

, In: 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Hsu, Fu-Jen ; Yen, Cheng-Tyng ; Hung, Chien-Chung... - p. 255-258 , 2019
Link: https://doi.org/10.1109/..
 
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11

SiC MOSFET with Integrated Zener Diode as an Asymmetric Bid..:

, In: 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Yen, Cheng-Tyng ; Hsu, Fu-Jen ; Chu, Kuo-Ting... - p. 135-138 , 2019
Link: https://doi.org/10.1109/..
 
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12

Influence of displacement damage induced by neutron irradia..:

Chao, Der-Sheng ; Shih, Hua-Yu ; Jiang, Jheng-Yi...
Japanese Journal of Applied Physics.  58 (2019)  SB - p. SBBD08 , 2019
Link: https://doi.org/10.7567/..
 
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13

77‐2: Anisotropic Nano‐Structure Light Control Film:

Wu, Lung-Hai ; Dai, Yu-Jyuan ; Chien, Chung-Hung..
SID Symposium Digest of Technical Papers.  50 (2019)  1 - p. 1102-1105 , 2019
Link: https://doi.org/10.1002/..
 
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14

A comprehensive study on the oxidation of 4H-SiC in diluted..:

Tseng, Yuan-Hung ; Wu, Tsung-Han ; Tsui, Bing-Yue...
Japanese Journal of Applied Physics.  56 (2017)  4S - p. 04CR02 , 2017
Link: https://doi.org/10.7567/..
 
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15

Negative bias temperature instability of SiC MOSFET induced..:

Yen, Cheng-Tyng ; Hung, Chien-Chung ; Hung, Hsiang-Ting...
Applied Physics Letters.  108 (2016)  1 - p. , 2016
Link: https://doi.org/10.1063/..
 
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