E-LIB Suche - Ergebnisse für: Hung, Yang-Hao

1

Improving Hot Carrier Reliability of Organic-TFTs by Extend..:

Hung, Wei-Chun ; Lin, Jia-Hong ; Chang, Ting-Chang...
IEEE Electron Device Letters. 44 (2023) 4 - p. 626-629 , 2023

2

Stably Saturated Output Current Characteristics and Hot-Car..:

Tu, Yu-Fa ; Huang, Jen-Wei ; Chang, Ting-Chang...
IEEE Transactions on Electron Devices. 70 (2023) 9 - p. 4669-4673 , 2023

Link: https://doi.org/10.1109/..

3

Asymmetric Electrode Structure Induces Dual-Channel Phenome..:

Tu, Yu-Fa ; Huang, Jen-Wei ; Chang, Ting-Chang...
IEEE Electron Device Letters. 44 (2023) 9 - p. 1496-1499 , 2023

Link: https://doi.org/10.1109/..

4

Analysis of self-heating-related instability in n-channel l..:

Tu, Yu-Fa ; Chang, Ting-Chang ; Zhou, Kuan-Ju...
Applied Physics Express. 15 (2022) 3 - p. 034003 , 2022

Link: https://doi.org/10.35848..

5

Structure of an In Situ Phosphorus-Doped Silicon Ultrathin ..:

Chen, Wei-Ting ; Yen, Ting-Yu ; Hung, Yang-Hao.
Nanomaterials. 12 (2022) 23 - p. 4307 , 2022

Link: https://doi.org/10.3390/..

6

Suppressing Drain-Induced Barrier Lowering and Kink Effect ..:

Zhou, Kuan-Ju ; Zheng, Yu-Zhe ; Tai, Mao-Chou...
IEEE Electron Device Letters. 43 (2022) 4 - p. 576-579 , 2022

Link: https://doi.org/10.1109/..

7

Gate Dielectric Leakage Reduction in Hard-Mask Defined and ..:

Chen, Jian-Jie ; Chang, Ting-Chang ; Hung, Yang-Hao...
IEEE Electron Device Letters. 43 (2022) 1 - p. 48-51 , 2022

Link: https://doi.org/10.1109/..

8

Abnormal Threshold Voltage Degradation Under Semi-On State ..:

Lin, Jia-Hong ; Ciou, Fong-Min ; Chang, Ting-Chang...
IEEE Electron Device Letters. 43 (2022) 9 - p. 1420-1423 , 2022

Link: https://doi.org/10.1109/..

9

Improving Reliability of a-InGaZnO TFTs With Optimal Locati..:

Tu, Yu-Fa ; Chiang, Cheng-Ling ; Chang, Ting-Chang...
IEEE Transactions on Electron Devices. 69 (2022) 6 - p. 3181-3185 , 2022

Link: https://doi.org/10.1109/..

10

Investigation of the Self-Heating Effect in High Performanc..:

Chen, Yu-An ; Zheng, Yu-Zhe ; Chang, Ting-Chang...
IEEE Electron Device Letters. 43 (2022) 8 - p. 1243-1246 , 2022

Link: https://doi.org/10.1109/..

11

Improving Drain-Induced Barrier Lowering Effect and Hot Car..:

Hung, Yang-Hao ; Chang, Ting-Chang ; Tu, Yu-Fa...
IEEE Electron Device Letters. 43 (2022) 4 - p. 569-572 , 2022

Link: https://doi.org/10.1109/..

12

Physical Mechanism of the Mechanical Bending of High-Perfor..:

Zheng, Yu-Zhe ; Chen, Yu-An ; Chen, Po-Hsun...
ACS Applied Electronic Materials. 4 (2022) 6 - p. 3000-3009 , 2022

Link: https://doi.org/10.1021/..

13

Structure of an In Situ Phosphorus-Doped Silicon Ultrathin ..:

Chen, Wei-Ting ; Yen, Ting-Yu ; Hung, Yang-Hao.
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC9736357/. , 2022

Link: http://www.ncbi.nlm.nih...

14

Long-term hematopoietic transfer of the anti-cancer and lif..:

Hung, Chun-Hao ; Wang, Jing-Ping ; Liou, Yae-Huei...
eLife. 12 (2024) - p. , 2024

Link: https://doi.org/10.7554/..

15

Long-term hematopoietic transfer of the anti-cancer and lif..:

Hung, Chun-Hao ; Wang, Jing-Ping ; Liou, Yae-Huei...
eLife. 12 (2024) - p. , 2024

Link: https://doi.org/10.7554/..